Using TOF-SIMS Spectrometry to Study the Kinetics of the Interfacial Retro Diels-Alder Reaction.

Autor: Hassouna L; Materials and Research Technology Department, Luxembourg Institute of Science and Technology, 5 Avenue des Hauts-Fourneaux, L-4362 Esch-sur-Alzette, Luxembourg.; Department of Physics and Materials Science, University of Luxembourg, 2 Avenue de l'Université, L-4365 Esch-sur-Alzette, Luxembourg., Enganati SK; Materials and Research Technology Department, Luxembourg Institute of Science and Technology, 5 Avenue des Hauts-Fourneaux, L-4362 Esch-sur-Alzette, Luxembourg.; Department of Physics and Materials Science, University of Luxembourg, 2 Avenue de l'Université, L-4365 Esch-sur-Alzette, Luxembourg., Bally-Le Gall F; University of Haute-Alsace, University of Strasbourg, CNRS, IS2M UMR 7361, F-68100 Mulhouse, France., Mertz G; Materials and Research Technology Department, Luxembourg Institute of Science and Technology, 5 Avenue des Hauts-Fourneaux, L-4362 Esch-sur-Alzette, Luxembourg., Bour J; Materials and Research Technology Department, Luxembourg Institute of Science and Technology, 5 Avenue des Hauts-Fourneaux, L-4362 Esch-sur-Alzette, Luxembourg., Ruch D; Materials and Research Technology Department, Luxembourg Institute of Science and Technology, 5 Avenue des Hauts-Fourneaux, L-4362 Esch-sur-Alzette, Luxembourg., Roucoules V; University of Haute-Alsace, University of Strasbourg, CNRS, IS2M UMR 7361, F-68100 Mulhouse, France.

Publikováno v: Materials (Basel, Switzerland) [Materials (Basel)] 2021 May 20; Vol. 14 (10). Date of Electronic Publication: 2021 May 20.