Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Endri Kaja"'
Autor:
Endri Kaja, Nicolas Gerlin, Monideep Bora, Keerthikumara Devarajegowda, Dominik Stoffel, Wolfgang Kunz, Wolfgang Ecker
Publikováno v:
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c382d6e0172ca2a6e4d901908beb964e
https://doi.org/10.1109/dft56152.2022.9962369
https://doi.org/10.1109/dft56152.2022.9962369
Autor:
Nicolas Gerlin, Endri Kaja, Monideep Bora, Keerthikumara Devarajegowda, Dominik Stoffel, Wolfgang Kunz, Wolfgang Ecker
Publikováno v:
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48733ea8be627e2e098a4d1f58355de4
https://doi.org/10.1109/vlsi-soc54400.2022.9939622
https://doi.org/10.1109/vlsi-soc54400.2022.9939622
Publikováno v:
DAC
The scalable and extendable RISC-V ISA introduced a new level of flexibility in designing highly customizable processors. This flexibility in processor designs adds to the complexity of already complex functional verification process. Although formal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b69d6531383d8d458bd9fafa25146268
https://doi.org/10.1109/dac18074.2021.9586264
https://doi.org/10.1109/dac18074.2021.9586264
Autor:
Endri Kaja, Wolfgang Ecker, Keerthikumara Devarajegowda, Zhao Han, Heimo Hartlieb, Varsha Bhupal Bavache
Publikováno v:
2020 17th Biennial Baltic Electronics Conference (BEC).
Fault tolerance enables the system to avoid threats (fail-safe) or continue with its safe operational functionality even in the presence of random faults. This ability comes at the cost of additional development efforts and the silicon overhead requi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::038b32f3b4e5488d40ad137bcc95ca72
https://doi.org/10.1109/bec49624.2020.9276994
https://doi.org/10.1109/bec49624.2020.9276994
Autor:
Wolfgang Ecker, Endri Kaja, Keerthikumara Devarajegowda, Sebastian Prebeck, Mounika Vaddeboina, Luis Rivas, Nicolas Gerlin, Zhao Han
Publikováno v:
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
DFT
DFT
Safety-critical designs used in automotive applications need to ensure reliable operations even under hostile operating conditions. As these designs grow in size and complexity, they are facing an increased risk of failure. Consequently, the methods
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f731959d0e819c848ababa4d7c53572c
