Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Endre Barti"'
Publikováno v:
Materials Testing. 61:1192-1196
The design of electric machines is motivated by electromagnetic and mechanical requirements. The magnetic flux is confined and guided by ferrite cores which consist of coated electrical sheets with a thickness of only a few tenths of a millimeter in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c28278a685353ccccfb5cbd3a02c9aac
https://doi.org/10.3139/120.111434
https://doi.org/10.3139/120.111434
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6b0fcb0e96fb38e90e929c6aa1be6254
https://doi.org/10.4271/2020-01-1573
https://doi.org/10.4271/2020-01-1573
In this paper, the dynamic behavior of copper and aluminum alloys as used in electric drive units is investigated. Isothermal frequency sweeps are performed from 0.1 up to 50 Hz at temperatures of up to 400 °C. An evaluation of the test results at a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fc1393c6b7171eed91ab967b5969a7b1
https://publica.fraunhofer.de/handle/publica/259649
https://publica.fraunhofer.de/handle/publica/259649
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::daa7a875b8b433a37bd8d7f852c20b30
https://doi.org/10.4271/2018-01-1498
https://doi.org/10.4271/2018-01-1498
Autor:
Balamurugan Karunamurthy, Endre Barti, Thomas Detzel, Javad Zarbakhsh, Carlos O. Trejo-Caballero
Publikováno v:
Microelectronics Reliability. 50:1666-1671
Finite element simulations were used to study the thermo-mechanical stress state at the chip corner in a chip–package system. Accurate geometry of a non-planar chip topology was created by digitizing images obtained with a scanning electron microsc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ce6a1210456ef24c4f624e14ddbe2bfa
https://doi.org/10.1016/j.microrel.2010.07.015
https://doi.org/10.1016/j.microrel.2010.07.015