Zobrazeno 1 - 10
of 59
pro vyhledávání: '"Emmanuel sarraute"'
Publikováno v:
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e1827a1237d8a767c3f865eee7cdd7ca
https://doi.org/10.1109/eurosime56861.2023.10100775
https://doi.org/10.1109/eurosime56861.2023.10100775
Publikováno v:
2022 20th International Conference on Harmonics & Quality of Power (ICHQP).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ccbee4117e4cbcdcbca0669d96fc9b01
https://doi.org/10.1109/ichqp53011.2022.9808564
https://doi.org/10.1109/ichqp53011.2022.9808564
Publikováno v:
Electronics; Volume 11; Issue 4; Pages: 595
In France, high-speed railway lines are powered by a 2 × 25 kV/50 Hz electrification system. The substations include two single-phase transformers connected to the high-voltage electrical transmission network on different pairs of phases according t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::01b65cd423961a9813d73bfa51ee84d9
Autor:
Céline Combettes, A. Bourennane, Vincent Bley, Ayad Ghannam, Amirouche Oumaziz, Frédéric Richardeau, Emmanuel Sarraute
Publikováno v:
32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021
32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, Oct 2021, Bordeaux, France
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2021, pp.114240. ⟨10.1016/j.microrel.2021.114240⟩
Microelectronics Reliability, 2021, pp.114240. ⟨10.1016/j.microrel.2021.114240⟩
32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, Oct 2021, Bordeaux, France
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2021, pp.114240. ⟨10.1016/j.microrel.2021.114240⟩
Microelectronics Reliability, 2021, pp.114240. ⟨10.1016/j.microrel.2021.114240⟩
Prix du meilleur article lors de la conférence « 32nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis » - ESREF 2021; International audience; In this paper, a first concept of monolithic semiconductor fuses on s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e85c00bac13e8f1ebb527d103495f65c
https://hal.science/hal-03372248/document
https://hal.science/hal-03372248/document
Publikováno v:
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe), Sep 2020, Lyon, France. pp.P.1-P.10, ⟨10.23919/EPE20ECCEEurope43536.2020.9215608⟩
22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe), Sep 2020, Lyon, France. pp.P.1-P.10, ⟨10.23919/EPE20ECCEEurope43536.2020.9215608⟩
International audience; In this work, we propose a new concept of fail-safe switching cells based on the use of integrated fuses. These fuses allow the circuit to be partially isolated and reconfigured, which therefore becomes fault tolerant and prev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc38f2505c10337f4db1de2993a6bcea
https://hal.archives-ouvertes.fr/hal-02980784
https://hal.archives-ouvertes.fr/hal-02980784
Autor:
Zhifeng Dou, Emmanuel sarraute, Frédéric Richardeau, Vincent Bley, Jean-Marc Blaquiere, Claire Vella, Gilles Gonthier
Publikováno v:
European Journal of Electrical Engineering. 16:409-424
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::392d3a2a90f5ed0a888496b9c3835913
https://doi.org/10.3166/ejee.16.409-424
https://doi.org/10.3166/ejee.16.409-424
Autor:
Frédéric Richardeau, Jean-Marc Blaquiere, Emmanuel Sarraute, Claire Vella, Vincent Bley, Gilles Gonthier, Zhifeng Dou
Publikováno v:
Microelectronics Reliability. 52:2457-2464
In this article a generic and passive dual-switch fuse is designed to symmetrically disconnect a switching cell against a leg short circuit failure. A compact FR4 copper tracks – PCB structure is proposed combining a dual-fuse mode and a passive du
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73075d2df942464c6319f4a2680fb4c3
https://doi.org/10.1016/j.microrel.2012.06.082
https://doi.org/10.1016/j.microrel.2012.06.082
Publikováno v:
Microelectronics Reliability. 51:1919-1926
An epoxy molded package is compared with a silicone gel module with IGBTs chips in short-circuit failure modes with respect to critical energy, I2Tmelting and explosion energy capabilities. Special importance was attached to “ohmic mode” assessme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de9adb37bec60b281fe110f8d7dada40
https://doi.org/10.1016/j.microrel.2011.07.031
https://doi.org/10.1016/j.microrel.2011.07.031
Publikováno v:
The European Physical Journal Applied Physics. 33:121-132
The electrical supply of portable electronic devices is a crucial problem, which may be solved by harvesting a part of the mechanical energy dissipated in our environment. For the last ten years, many prototype piezoelectric generators have been prop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::153e5b27d188aaf8e65d9792f8197bc5
https://doi.org/10.1051/epjap:2006017
https://doi.org/10.1051/epjap:2006017
Publikováno v:
IEEE Transactions on Power Electronics. 21:56-65
In this paper, a new complementary gate driver for power metal-oxide semiconductor field-effect transistors and insulated gate bipolar transistors is presented based on the use of a piezoelectric transformer (PT). This type of transformer has a high
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f498f5bdc5f5aa4c5f156f195c11e2a5
https://doi.org/10.1109/tpel.2005.861121
https://doi.org/10.1109/tpel.2005.861121