Zobrazeno 1 - 10
of 44
pro vyhledávání: '"Emmanuel Defaÿ"'
Publikováno v:
Integrated Ferroelectrics. 80:115-124
This study investigates the influence of a STO seeding layer on the crystallization of PZT thin films. It is shown that a reduction in crystallization temperature higher than 100°C can be achieved. STO layers less than 3 nm-thick induce a strong (11
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94f27ddeae798317f72938303f28e39e
https://doi.org/10.1080/10584580600656635
https://doi.org/10.1080/10584580600656635
Autor:
Emmanuel Defaÿ
Publikováno v:
Integration of Ferroelectric and Piezoelectric Thin Films ISBN: 9781118616635
Integration of Ferroelectric and Piezoelectric Thin Films: Concepts and Applications for Microsystems
Integration of Ferroelectric and Piezoelectric Thin Films: Concepts and Applications for Microsystems
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35d83c21074d30bb28d6e5de710e0072
https://doi.org/10.1002/9781118616635.ch10
https://doi.org/10.1002/9781118616635.ch10
Autor:
Emmanuel Defaÿ
Publikováno v:
Integration of Ferroelectric and Piezoelectric Thin Films ISBN: 9781118616635
Integration of Ferroelectric and Piezoelectric Thin Films: Concepts and Applications for Microsystems
Integration of Ferroelectric and Piezoelectric Thin Films: Concepts and Applications for Microsystems
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb82a558839718d064116bea3ab07e2c
https://doi.org/10.1002/9781118616635.ch11
https://doi.org/10.1002/9781118616635.ch11
Autor:
Emmanuel Defaÿ
This book describes up-to-date technology applied to high-K materials for More Than Moore applications, i.e. microsystems applied to microelectronics core technologies. After detailing the basic thermodynamic theory applied to high-K dielectrics thin
Autor:
Emmanuel Defaÿ
This book contains four parts. The first one is dedicated to concepts. It starts with the definitions and examples of what is piezo-pyro and ferroelectricity by considering the symmetry of the material. Thereafter, these properties are described with
Autor:
Emmanuel Defaÿ
Publikováno v:
Ferroelectric Dielectrics Integrated on Silicon: Defaÿ/Ferroelectric Dielectrics Integrated on Silicon
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::541e49c8614ab449f0579ae081038218
https://doi.org/10.1002/9781118602751
https://doi.org/10.1002/9781118602751
Autor:
Defaÿ, Emmanuel
Publikováno v:
Integration of Ferroelectric & Piezoelectric Thin Films; 2013, pi-xviii, 15p
Autor:
Defaÿ, Emmanuel
Publikováno v:
Ferroelectric Dielectrics Integrated on Silicon; 2013, p443-444, 2p
Autor:
Poncet, P., Casset, F., Latour, A., Santos, F. Domingues Dos, Pawlak, S., Gwoziecki, R., Fanget, S.
Publikováno v:
2016 17th International Conference on Thermal, Mechanical & Multi-Physics Simulation & Experiments in Microelectronics & Microsystems (EuroSimE); 2016, p1-5, 5p
Autor:
Defaÿ, Emmanuel
Publikováno v:
Integration of Ferroelectric & Piezoelectric Thin Films; 2013, p315-356, 42p