Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Emmanuel C. Onyiriuka"'
Publikováno v:
Journal of Adhesion Science and Technology. 11:929-940
The adhesion and delamination behavior of sputtered Ta and Cr films on barium boroaluminosilicate glass were investigated. The locus of delamination was determined by XPS analysis of peeled film strips to be at the film-glass interface. We found a st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::315914311ddf713fe46099fe61814f4c
https://doi.org/10.1163/156856197x00507
https://doi.org/10.1163/156856197x00507
Autor:
Emmanuel C. Onyiriuka
Publikováno v:
Journal of Adhesion Science and Technology. 10:617-633
A reactive form of a polymeric carbohydrate molecule, dialdehyde starch (DAS), physically adsorbed on polystyrene (PS) which acts as an alternative to chemical modification of the surface has been evaluated by XPS and IR. The DAS binding sites were a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::874b7014ae79aa4168d455104a8e81bd
https://doi.org/10.1163/156856196x00670
https://doi.org/10.1163/156856196x00670
Publikováno v:
Journal of Materials Research. 10:2120-2127
Surface chemical studies on zinc phosphate glasses were carried out with an ammonia probe using FTIR and XPS. Low softening point zinc phosphate glasses can be co-extruded with high softening point polymers to form polymer filled blends. NH3 reacts w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::709daeccdfa011168c81c272c4ff2552
https://doi.org/10.1557/jmr.1995.2120
https://doi.org/10.1557/jmr.1995.2120
Autor:
Emmanuel C. Onyiriuka
Publikováno v:
Chemistry of Materials. 5:798-801
The AM 2001 fluorocarbon lubricant overlayer on carbon-coated canasite glass-ceramic magnetic memory disks has been characterized by XPS. Lubricant thickness is linear with the concentration of the lubricant in the lubricating solution. For both the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b8da25b0883453f61e214d1ac534e64
https://doi.org/10.1021/cm00030a014
https://doi.org/10.1021/cm00030a014
Publikováno v:
Journal of Colloid and Interface Science. 144:98-102
Polystyrene tissue culture vessels are commercially treated by corona discharge or plasma surface oxidation to provide a hydrophilic surface, with 15–20% surface oxygen. ESCA and FTIR showed that oxidation forms hydroxyl, carbonyl, and carboxyl gro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62f4a1f0471281ba68a20b3eabadeab7
https://doi.org/10.1016/0021-9797(91)90241-y
https://doi.org/10.1016/0021-9797(91)90241-y
Publikováno v:
Applied Spectroscopy. 44:808-811
The effect of gamma-radiation on the surface chemical properties of polystyrene was studied by ESCA and FT-IR. Gamma-radiation produces surface >C=O and C-O containing functional groups only, and also causes oxidation to depths >10 nm as detected by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7c03b7da1076c0ffee21565051068c6
https://doi.org/10.1366/0003702904086975
https://doi.org/10.1366/0003702904086975
Publikováno v:
Applied Spectroscopy. 47:1609-1611
Polystyrene surfaces are often corona-discharge or plasma treated to oxidize the surface, which enhances the wettability. X-ray photoelectron spectroscopy (XPS), which requires time and an ultra-high vacuum, is generally used to measure this surface
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e3fde224f782a68200ebe76a2be4908a
https://doi.org/10.1366/0003702934334688
https://doi.org/10.1366/0003702934334688
Autor:
Emmanuel C. Onyiriuka
Publikováno v:
Applied Spectroscopy. 47:35-37
X-ray photoelectron spectroscopy (XPS or ESCA), combined with argonion sputter depth profiling, has been employed for the characterization of aluminum, titanium boride, and nitride films deposited by dc-magnetron sputtering from multicomponent alloy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3ee424943cf6cb2a2bcc2ac6f48834b
https://doi.org/10.1366/0003702934048488
https://doi.org/10.1366/0003702934048488
Publikováno v:
Fourth International Conference on Thin Film Physics and Applications.
Sputter deposition process conditions for dielectric metal oxide films was simulated by SIMSPUDTM (Simulation of Sputtered Distributions). Collision cross-sections of Nb and Si were found to be 50 angstroms2 and 55 angstroms2 respectively by pinhole
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7c31f850c52a49745473b2d1f3ea027d
https://doi.org/10.1117/12.408294
https://doi.org/10.1117/12.408294
Publikováno v:
Fourth International Conference on Thin Film Physics and Applications.
We report a unique technique to measure the refractive index (n), extinction coefficient (k), and thickness of thin films based on either the reflection or transmission spectra. The method combines a spectrometer, an optical microscope and a video ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eabc36a225f0b8df312f80b8cd93503a
https://doi.org/10.1117/12.408415
https://doi.org/10.1117/12.408415