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Autor:
Emily S. Jones, Christopher D. Ziomek
Publikováno v:
2009 IEEE AUTOTESTCON.
Comprehensive waveform generation is an important functional component of automated test equipment (ATE). Waveform generators synthesize signal stimuli to be applied to a device under test (DUT). As military and commercial electronics become increasi
Autor:
Emily S. Jones, J. Michael Moore
Publikováno v:
The Modern Language Journal. 52:523