Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Emilis Šermukšnis"'
Autor:
Emilis Šermukšnis, Artūr Šimukovič, Vitaliy Avrutin, Natalia Izyumskaya, Ümit Özgür, Hadis Morkoç
Publikováno v:
Crystals, Vol 14, Iss 1, p 75 (2024)
Pulsed hot-electron microwave noise measurements of the (Be)MgZnO/ZnO heterostructures are presented in this work. The heterostructures of different barrier thicknesses and different bulk electron densities in ZnO layer are compared. Capacitance–vo
Externí odkaz:
https://doaj.org/article/232990cc55594e308b20749abfbfb673
Autor:
Emilis Šermukšnis, Justinas Jorudas, Artūr Šimukovič, Vitalij Kovalevskij, Irmantas Kašalynas
Publikováno v:
Applied Sciences, Vol 12, Iss 21, p 11079 (2022)
In this work, we investigated the self-heating effects of annealed Ti/Al/Ni/Au ohmic contacts and two-dimensional electron gas (2DEG) in AlGaN/GaN heterostructures under strong electric field by using the short pulse current–voltage and microwave n
Externí odkaz:
https://doaj.org/article/7a6682bd17244447b2d92e6e55699c7c
Autor:
Sandra Pralgauskait˙e, Jonas Matukas, Vilius Palenskis, Juozas Vyšniauskas, Emilis Šermukšnis, Gregory Letal, Robert Mallard, Saulius Smetona
Publikováno v:
Journal of Telecommunications and Information Technology, Iss 1 (2003)
A laser diode reliability test based on the measurements of the low-frequency optical and electrical noise, and their correlation factor changes during short-time ageing is presented. The noise characteristics reveal obvious differences between the s
Externí odkaz:
https://doaj.org/article/b39bff99bcf54cc8b6846b78606cf2af
Autor:
Vitaliy S. Avrutin, Ümit Özgür, Hadis Morkoç, Linas Ardaravicius, Arthur Šimukovic, Emilis Šermukšnis
Publikováno v:
Oxide-based Materials and Devices XIV.