Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Emile van der Drift"'
Autor:
Claire Wyman, Anja van Langen-Suurling, Marijn T.J. van Loenhout, Thomas Henighan, Jacob W. J. Kerssemakers, Iwijn De Vlaminck, Indriati Pfeiffer, Julius Huijts, Allard J. Katan, Emile van der Drift, Cees Dekker
Publikováno v:
Nano Letters, 11(12), 5489-5493. American Chemical Society
Single-molecule force-spectroscopy methods such as magnetic and optical tweezers have emerged as powerful tools for the detailed study of biomechanical aspects of DNA-enzyme interactions. As typically only a single molecule of DNA is addressed in an
Publikováno v:
Journal of Vacuum Science & Technology B, 26 (6), 2008
Performance of hydrogen silsesquioxane (HSQ) resist material with respect to the temperature during electron beam exposure was investigated. Electron beam exposure at elevated temperatures up to 90?°C shows sensitivity rise and slight contrast (?) d
Publikováno v:
Phosphorus Sulfur and Silicon and the Related Elements, 93(1-4), 277-280. GORDON BREACH SCI PUBL LTD
New terpolymers containing phosphazene, epoxy and silicon moieties have been synthesized which were used as negative resists in microlithography. In addition to synthesis and characterization, lithographic properties are discussed.
Autor:
Diederik Maas, Emile van der Drift
Publikováno v:
Nanofabrication ISBN: 9783709104231
Recent developments show that Scanning Helium Ion Beam Lithography (SHIBL) with a sub-nanometer beam diameter is a promising alternative fabrication technique for high-resolution nanostructures at high pattern densities. Key principles and critical c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69e5da76b41812421b537bc394c402e6
https://doi.org/10.1007/978-3-7091-0424-8_4
https://doi.org/10.1007/978-3-7091-0424-8_4
Autor:
Jeroen Meessen, Paul F. A. Alkemade, Diederik Maas, Maria Rudneva, Emile van Veldhoven, Emile van der Drift
Publikováno v:
MRS Proceedings. 1354
Although Helium Ion Microscopy (HIM) was introduced only a few years ago, many new application fields are budding. The connecting factor between these novel applications is the unique interaction of the primary helium ion beam with the sample materia
Autor:
V. Sidorkin, Emile van Veldhoven, Ping Chen, Paul F. A. Alkemade, Diederik Maas, Emile van der Drift, H. W. M. Salemink
Publikováno v:
Proceedings of SPIE, 2010 vol. 7638
Proceedings of SPIE, 2010, vol. 7638
Proceedings of SPIE, 2010, vol. 7638
The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized
Autor:
Khashayar Babaei Gavan, Paddy J. French, Hamed Sadeghian, Emile van der Drift, Fred van Keulen, Herre S. J. van der Zant, Johannes F.L. Goosen, C.K. Yang, Andre Bossche
Publikováno v:
Journal of micromechanics and microengineering, 20 (10) 2010
Micro/nano resonant cantilevers with a laser deflection readout have been very popular in sensing applications over the past years. Despite the popularity, however, most of the research has been devoted to increasing the sensitivity, and very little
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d218be7886d53c5423c6fb80a70f6044
http://resolver.tudelft.nl/uuid:c6120e36-e2dc-408a-bfd1-d72e159e18d2
http://resolver.tudelft.nl/uuid:c6120e36-e2dc-408a-bfd1-d72e159e18d2
Publikováno v:
2009 IEEE Sensors.
We present experimental data on resonant behavior of the first flexural mode of a silicon nitride cantilever in noble gas ambients of He, Ar, and Xe. To this aim thermal noise spectra have been measured with an optical setup. Overall resonance freque
Autor:
Johannes F.L. Goosen, Hamed Sadeghian, Herre S. J. van der Zant, Fred van Keulen, Khashayar Babaei Gavan, Andre Bossche, C.K. Yang, Emile van der Drift, Paddy J. French
Publikováno v:
2009 IEEE Sensors.
Laser beam deflection is a well known method commonly used in detecting resonance frequencies in atomic force microscopes and in mass/force sensing. The method focuses a laser spot on the surface of cantilevers to be measured, which might change the
Autor:
Herre S. J. van der Zant, Khashayar Babaei Gavan, H.J.R. Westra, Warner J. Venstra, Emile van der Drift
Publikováno v:
Applied Physics Letters, 94 (23), 2009
The effective Young’s modulus of silicon nitride cantilevers is determined for thicknesses in the range of 20–684 nm by measuring resonance frequencies from thermal noise spectra. A significant deviation from the bulk value is observed for cantil