Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Emile, van Veldhoven"'
Autor:
Nicole Meulendijks, Marieke Burghoorn, Emile van Veldhoven, Daniel Mann, Maurice C. D. Mourad, Renz van Ee, Pascal Buskens, Guy Bex, Marcel A. Verheijen, Helmut Keul
Publikováno v:
Cellulose, 24, 2191–2204
Cellulose, 24(5). Springer
Cellulose, 24(5). Springer
For the preparation of electrically conductive composites, various combinations of cellulose and conducting materials such as polymers, metals, metal oxides and carbon have been reported. The conductivity of these cellulose composites reported to dat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ce98d0aeeefc5b5a5aec57a2c0fa04fe
https://doi.org/10.1007/s10570-017-1240-y
https://doi.org/10.1007/s10570-017-1240-y
Autor:
Emile van Veldhoven, Maurice C. D. Mourad, Renz van Ee, Marieke Burghoorn, Nicole Meulendijks, Pascal Buskens, Marcel A. Verheijen
Publikováno v:
Colloids and Surfaces A: Physicochemical and Engineering Aspects, 487, 1-8. Elsevier
The use of cellulose nanocrystals (CNCs) in optical materials has been extensively studied. Key in most applications reported to date is the chiral nematic ordering of CNCs. Here, we demonstrate that random packing of silicated CNCs can also yield ma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7515d4450e9a16e319f036eb78e27ecf
https://doi.org/10.1016/j.colsurfa.2015.09.041
https://doi.org/10.1016/j.colsurfa.2015.09.041
Publikováno v:
Scanning. 34:90-100
Although helium ion microscopy (HIM) was introduced only a few years ago, many new application fields are emerging. The connecting factor between these novel applications is the unique interaction of the primary helium ion beam with the sample materi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16614890c931d5509ec6b982559af9d5
https://doi.org/10.1002/sca.21009
https://doi.org/10.1002/sca.21009
Autor:
Wenshan Cai, Qianjin Wang, Jingxuan Cai, Emile van Veldhoven, Zhouyang Zhu, Wen-Di Li, Paul F. A. Alkemade, Haixiong Ge, Sean P. Rodrigues
Publikováno v:
Advanced Materials Interfaces. 5:1800203
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::867857b29550e46c695d38f381621c7a
https://doi.org/10.1002/admi.201800203
https://doi.org/10.1002/admi.201800203
Publikováno v:
Journal of Materials Research, 28 (8), 2013
Journal of Materials Research
Journal of Materials Research, 8, 28, 1013-1020
Journal of Materials Research
Journal of Materials Research, 8, 28, 1013-1020
In this article, we present novel sample preparation methods using a helium ion microscope (HIM). We report the possibility of reshaping, at room temperature, thin metal lines on an electron-transparent membrane: A set of platinum bridges with standa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c9f2417073ee964a0d30a308649b3c37
https://doi.org/10.1557/jmr.2013.30
https://doi.org/10.1557/jmr.2013.30
Publikováno v:
MRS Proceedings
2012 MRS Spring Meeting, 9-13 April 2012, San Francisco, CA, USA, 1455, 61-72
2012 MRS Spring Meeting, 9-13 April 2012, San Francisco, CA, USA, 1455, 61-72
In this paper we propose a few helium ion microscope (HIM)-based methods for sample preparation and modification. In particular we report the use of the HIM to make thin wedge SrTiO3 samples without significant artifacts, the possibility to reshape t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::19f365882fd606b9f3def670086abac6
Publikováno v:
Scanning. 34(2)
Although helium ion microscopy (HIM) was introduced only a few years ago, many new application fields are emerging. The connecting factor between these novel applications is the unique interaction of the primary helium ion beam with the sample materi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::7060e14b75eb10fa2f3b503cd4db27df
https://pubmed.ncbi.nlm.nih.gov/22544486
https://pubmed.ncbi.nlm.nih.gov/22544486
Autor:
Yariv Drezner, Daniel Fishman, Richard H. Livengood, Yuval Greenzweig, Diederik Maas, Amir Raveh, Emile van Veldhoven
Publikováno v:
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 4, 30
In this paper we studied helium ion beam induced deposition (HIBID) of Pt on a silicon wafer using the recently commercialized helium ion microscope (HIM) at 25 kV and low beam currents. The motivation of this work was to understand the impact of lig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e3a6448190772a9b836c33e22d1b355
http://resolver.tudelft.nl/uuid:ba9ae2db-fbc3-4a90-a7fa-4a0bca5c6d27
http://resolver.tudelft.nl/uuid:ba9ae2db-fbc3-4a90-a7fa-4a0bca5c6d27
Publikováno v:
Microscopy and Microanalysis, June 16, 2011
In recent years, novel ion sources have been designed and developed that have enabled focused ion beam machines to go beyond their use as nano-fabrication tools. Secondary electrons are usually taken to form images, for their yield is high and strong
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4fbf8bda3b6514b921eb584f52fa4552
http://resolver.tudelft.nl/uuid:da1a57c4-9005-4d78-bc78-d12e77ffaa42
http://resolver.tudelft.nl/uuid:da1a57c4-9005-4d78-bc78-d12e77ffaa42
Autor:
Jeroen Meessen, Paul F. A. Alkemade, Diederik Maas, Maria Rudneva, Emile van Veldhoven, Emile van der Drift
Publikováno v:
MRS Proceedings. 1354
Although Helium Ion Microscopy (HIM) was introduced only a few years ago, many new application fields are budding. The connecting factor between these novel applications is the unique interaction of the primary helium ion beam with the sample materia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1bbd8fcc70391f2a6b08803ff44b83da
https://doi.org/10.1557/opl.2011.1407
https://doi.org/10.1557/opl.2011.1407