Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Elven Huang"'
Autor:
Qijian Wan, Marfei Fei, Jet Jiang, Frank Hou, Elven Huang, Gavin Li, David Wang, Summy Chen, Liang Cao, Saikiran Madhusudhan, Sankaranarayanan Paninjath, Leo Tian, Chunshan Du, Xinyi Hu, Qian Xie
Publikováno v:
2020 International Workshop on Advanced Patterning Solutions (IWAPS).
As the semiconductor manufacturing continues its march towards more advanced technology nodes, design and process introduced systematic defects become significant yield limiters [1]. Therefore, identification and characterization of these systematic
Autor:
Marfe Ma, Kuan Hu, Elven Huang, Xinyi Hu, Zhengfang Liu, Jet Jiang, Chunshan Du, Qijian Wan, Wael ElManhawy, Gavin Li, Frank Hou
Publikováno v:
Design-Process-Technology Co-optimization for Manufacturability XIV.
Silicon weak pattern exploration becomes more and more attractive for yield improvement and design robustness as these proven silicon weak patterns or hotspots directly reveals process weakness and should be avoided to occur on the chip design. At th
Autor:
I. Y. Chang, Xiang Fang, Elven Huang, Hung-Yueh Liao, Chuan-Chun Lee, Ling-Chieh Lin, Chien-Nan Lin, Min-Ying Lu, Hsu-Tang Liu, Chuen-Huei Yang, Erwin Deng, Shou-Yuan Ma, Ming-Feng Shen, Jonathan Muirhead
Publikováno v:
Photomask Japan 2018: XXV Symposium on Photomask and Next-Generation Lithography Mask Technology.
In this paper we combined the hotspot pattern library and the rule-based scoring system into a modularized hotspot-checking rule deck running on an automatic flow. Several DFM (design for manufacture) properties criteria will be defined to build a
Autor:
Legender Yang, Yu Zhu, Elaine Zou, Huan Kan, Chunshan Du, Jonathan Muirhead, Recoo Zhang, Qijian Wan, Zhengfang Liu, Xinyi Hu, Elven Huang, Lucas Huang
Publikováno v:
Design-Process-Technology Co-optimization for Manufacturability XII.
Memory is a critical component in today's system-on-chip (SoC) designs. Static random-access memory (SRAM) blocks are assembled by combining intellectual property (IP) blocks that come from SRAM libraries developed and certified by the foundries for
Autor:
Huan Kan, Lucas Huang, Legender Yang, Elaine Zou, Qijian Wan, Chunshan Du, Xinyi Hu, Zhengfang Liu, Yu Zhu, Recoo Zhang, Elven Huang, Muirhead, Jonathan
Publikováno v:
Proceedings of SPIE; 1/16/2018, Vol. 10588, p1-6, 6p