Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Eloïse Guen"'
Publikováno v:
Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2021, 119 (16), pp.161602. ⟨10.1063/5.0064244⟩
Applied Physics Letters, 2021, 119 (16), pp.161602. ⟨10.1063/5.0064244⟩
Applied Physics Letters, American Institute of Physics, 2021, 119 (16), pp.161602. ⟨10.1063/5.0064244⟩
Applied Physics Letters, 2021, 119 (16), pp.161602. ⟨10.1063/5.0064244⟩
International audience; The impact of surface roughness on conductive heat transfer across nanoscale contacts is investigated by means of scanning thermal microscopy. Silicon surfaces with out-of-plane rms roughness of ~0, 0.5, 4, 7 and 11 nm are sca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ac49b49a707e4f0f62ccda6be5a1f5b3
Autor:
Miroslav Valtr, Olga Kazakova, Tony Maxwell, Petr Klapetek, Severine Gomes, Alexandre Allard, Bruno Hay, Eloïse Guen, David Renahy, Guillaume Davee, Pierre-Olivier Chapuis, Robert Puttock, Jan Martinek
Publikováno v:
International Journal of Thermal Sciences
International Journal of Thermal Sciences, Elsevier, 2020, 156, pp.106502. ⟨10.1016/j.ijthermalsci.2020.106502⟩
International Journal of Thermal Sciences, Elsevier, 2020, 156, pp.106502. ⟨10.1016/j.ijthermalsci.2020.106502⟩
We assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for determining the local phase transition temperature of polymeric materials by means of nano-thermomechanical analysis (nano-TA). Reference semi-cry
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1d3b4a3e0e7f7e9434e66d7a9383a759
https://hal.archives-ouvertes.fr/hal-03013845
https://hal.archives-ouvertes.fr/hal-03013845
Autor:
C. M. Sotomayor-Torres, Pierre-Olivier Chapuis, W. Sun, G. Hamaoui, Francesc Alzina, Severine Gomes, A. El Sachar, Eloïse Guen
Publikováno v:
2020 26th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
2020 26th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Sep 2020, Berlin, France. pp.226-231, ⟨10.1109/THERMINIC49743.2020.9420489⟩
2020 26th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Sep 2020, Berlin, France. pp.226-231, ⟨10.1109/THERMINIC49743.2020.9420489⟩
Polystyrene (PS) thin films spin coated on either silicon or quartz substrates were prepared to investigate the thin film's thickness effects on both the heat transport and glass phase transition temperature of the PS. This characterisation has been
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7e4cbe08b040c728d3c7db1b157cb54c
https://hal.archives-ouvertes.fr/hal-03462728
https://hal.archives-ouvertes.fr/hal-03462728
Autor:
Jonathan M. R. Weaver, Philipp Dobson, Eloïse Guen, Severine Gomes, Gordon B Mills, R. K. Rajkumar, Pierre-Olivier Chapuis
Publikováno v:
Journal of Applied Physics
Journal of Applied Physics, American Institute of Physics, 2020, 128, pp.235301
Journal of Applied Physics, 2020, 128, pp.235301
Journal of Applied Physics, American Institute of Physics, 2020, 128, pp.235301
Journal of Applied Physics, 2020, 128, pp.235301
International audience; We propose an approach for the characterization of scanning thermal microscopy (SThM) probe response using a sample with silicon dioxide steps. The chessboard-like sample provides a series of nine surfaces made of the same mat
Autor:
Petr Klapetek, Tony Maxwell, Alexandre Allard, Miroslav Valtr, Eloïse Guen, Severine Gomes, David Renahy, Bruno Hay, Robb Puttock, Jan Martinek, Pierre-Olivier Chapuis
Publikováno v:
24th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
24th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Sep 2018, Stockholm, Denmark. pp.1-6, ⟨10.1109/THERMINIC.2018.8593308⟩
24th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Sep 2018, Stockholm, Denmark. pp.1-6, ⟨10.1109/THERMINIC.2018.8593308⟩
We first assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for the simultaneous identification of the local thermal conductivity and phase transition temperature of polymeric materials. In a second step,
Autor:
Jean-Marie Bluet, Eloïse Guen, David Renahy, Mouhannad Massoud, Severine Gomes, Pierre-Olivier Chapuis
Publikováno v:
THERMINIC 22 (Thermal Investigation of ICs and Systems)_Session 6: Quantiheat Project / Nano-scale Thermal Investigations
THERMINIC 22 (Thermal Investigation of ICs and Systems)_Session 6: Quantiheat Project / Nano-scale Thermal Investigations, Sep 2016, Budapest, Hungary
THERMINIC 22 (Thermal Investigation of ICs and Systems)_Session 6: Quantiheat Project / Nano-scale Thermal Investigations, Sep 2016, Budapest, Hungary
This work analyses the heat transfer between various scanning thermal microscopy (SThM) probes and samples. In order to perform quantitative measurements with SThM techniques, we have developed well-established and reproducible calibration methodolog
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c1eecbc0e33ec35478b6ac8dc1897d2c
https://hal.archives-ouvertes.fr/hal-01464327
https://hal.archives-ouvertes.fr/hal-01464327