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pro vyhledávání: '"Elliot L. Claveau"'
Autor:
Guangjiang Li, Elliot L. Claveau, Sudheer K. Jawla, Samuel C. Schaub, Michael A. Shapiro, Richard J. Temkin
Publikováno v:
IEEE Trans Terahertz Sci Technol
The reflectance [Formula: see text] and transmittance [Formula: see text] of Si and GaAs wafers irradiated by a 6 ns pulsed, 532 nm laser have been studied for s- and p-polarized 250 GHz radiation as a function of laser fluence and time. The measurem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bd9dd849ab4eee8d70f3fc3d7ab125b7
https://europepmc.org/articles/PMC10321468/
https://europepmc.org/articles/PMC10321468/
