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Silicon carbide silicon carbide (SiC SiC) composites are often used in oxidizing environments at high temperatures. Measurements of the thermal conductance of the oxide layer provide a way to better understand the oxidation process with high spatial
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0cb2bf11142951ee778aea70f43b5cdb
Publikováno v:
MRS Advances. 2:3607-3612
Polymer imprint thermal mapping (PITM) is a high-resolution thermal mapping technique that is especially valuable for nanoscale plasmonic devices. PITM leverages a ∼50 nm polymer film coating that crosslinks irreversibly with temperature, which rec
Publikováno v:
MRS Advances. 2:3613-3618
Thermal characterization of nano-featured devices is a critical challenge for the development of high performance devices. Although far-field thermoreflectance imaging is limited in spatial resolution by the optical diffraction limit, it is more amen
Autor:
Aleksandr V. Chernatynskiy, David G. Cahill, Simon R. Phillpot, Xue Xiong, Kiyoung Lee, Eugene J. Ragasa, Che Hui Lee, Natalie M. Dawley, Darrell G. Schlom, Ella Pek
Publikováno v:
Applied Physics Letters. 118:091904
Unlike many superlattice structures, Ruddlesden–Popper phases have atomically abrupt interfaces useful for interrogating how periodic atomic layers affect thermal properties. Here, we measure the thermal conductivity in thin films of the n = 1–5
Publikováno v:
2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm).
Thermal characterization of nano-featured devices is a critical challenge for the development of high performance devices. Although far-field thermoreflectance imaging is limited in spatial resolution by the optical diffraction limit, it is more amen