Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Elena Pascal"'
Publikováno v:
Acta Materialia. 199:370-382
Accurate indexing of EBSD patterns presents a challenging problem. We propose a new convolutional neural network (EBSD-CNN) to realize real-time indexing of EBSD patterns; we implement a disorientation loss function to adapt a standard CNN model for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15d69322c3e6aed8942e8c9f5a3374c9
https://doi.org/10.1016/j.actamat.2020.08.046
https://doi.org/10.1016/j.actamat.2020.08.046
Autor:
Benjamin H. Williams, Richard J. Gildea, James Beilsten-Edmands, Gwyndaf Evans, David McDonagh, David G. Waterman, Elena Pascal, Graeme Winter, Markus Gerstel, Nicholas E. Devenish
Publikováno v:
Protein Science : A Publication of the Protein Society
The DIALS software for the processing of X‐ray diffraction data is presented, with an emphasis on how the suite may be used as a toolkit for data processing. The description starts with an overview of the history and intent of the toolkit, usage as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d6e4ebc44fd7a034e7262fb2644d8fc5
https://pubmed.ncbi.nlm.nih.gov/34747533
https://pubmed.ncbi.nlm.nih.gov/34747533
Autor:
F. Mehnke, A. Alasmari, T. Wernicke, Aimo Winkelmann, Elena Pascal, L. Jiu, S. Hagedorn, Philip A. Shields, B.M. Jablon, W. Avis, Paul R. Edwards, Peter J. Parbrook, M. Nouf-Allehiani, Y. Gong, C. Kuhn, Yonghao Zhang, Gunnar Kusch, Robert W. Martin, Michael Kneissl, Jochen Bruckbauer, Benjamin Hourahine, S. Vespucci, Tao Wang, S. Kraeusel, J. Enslin, R. McDermott, P. M. Coulon, G. Naresh-Kumar, Carol Trager-Cowan, M. D. Smith, Sebastian Walde, R. M. Smith, Markus Weyers, Roy L. Johnston, Arne Knauer, Ken Mingard, David M. Thomson
In this article we describe the scanning electron microscopy (SEM) techniques of electron channelling contrast imaging and electron backscatter diffraction. These techniques provide information on crystal structure, crystal misorientation, grain boun
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ec5daaf27a3bb173a9ce0f9885b89bc6
https://strathprints.strath.ac.uk/74728/7/Trager_Cowan_etal_IOPCS_MSE_2020_Advances_in_electron_channelling_contrast_imaging_and_electron_backscatter_diffraction.pdf
https://strathprints.strath.ac.uk/74728/7/Trager_Cowan_etal_IOPCS_MSE_2020_Advances_in_electron_channelling_contrast_imaging_and_electron_backscatter_diffraction.pdf
Autor:
Jochen Bruckbauer, Ben Hourahine, William Avis, Angus J. Wilkinson, M. Nouf-Allehiani, Ken Mingard, David J. Thomson, Albes Kotzai, Ryan McDermott, Gunnar Kusch, Robert W. Martin, Dale Waters, Arantxa Vilalta-Clemente, Paul R. Edwards, Aeshah Alasamari, Aimo Winkelmann, Peter J. Parbrook, Carol Trager-Cowan, G. Naresh-Kumar, Elena Pascal
Publikováno v:
Gallium Nitride Materials and Devices XV.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac4804a723551139bd5e9c577f72eac0
https://doi.org/10.1117/12.2544228
https://doi.org/10.1117/12.2544228
Autor:
Arne Knauer, Christian Kuhn, Marcus Weyers, M. D. Smith, Benjamin Hourahine, S. Hagedorn, M. Nouf-Allehiani, G. Naresh-Kumar, Elena Pascal, David M. Thomson, Peter J. Parbrook, Y. Gong, Sebastian Walde, A Kotzai, S. Kraeusel, R. M. Smith, W. Avis, Tim Wernicke, Gunnar Kusch, Robert W. Martin, Tao Wang, L. Jiu, Aimo Winkelmann, Johannes Enslin, R. McDermott, A. Alasmari, Yonghao Zhang, Frank Mehnke, Michael Kneissl, Jochen Bruckbauer, Jie Bai, Paul R. Edwards, Philip A. Shields, Gergely Ferenczi, S. Vespucci, P. M. Coulon, Carol Trager-Cowan
Publikováno v:
Semiconductor Science and Technology. 35:054001
The scanning electron microscopy techniques of electron backscatter diffraction (EBSD), electron channelling contrast imaging (ECCI) and cathodoluminescence (CL) hyperspectral imaging provide complementary information on the structural and luminescen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::badc5c4ecafcbc98c0299df4e120403a
https://doi.org/10.1088/1361-6641/ab75a5
https://doi.org/10.1088/1361-6641/ab75a5
Publikováno v:
Microscopy and Microanalysis
Dislocation contrast in the SEM, as observed though electron channelling contrast imaging (ECCI), is commonly treated analogously to the contrast in the TEM. This perception is based on early studies done for dislocations parallel with the surface wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::431ac95621d5693f7ecf07b6db531896
https://doi.org/10.1017/s1431927619010572
https://doi.org/10.1017/s1431927619010572
Autor:
Elena, Pascal, Saransh, Singh, Patrick G, Callahan, Ben, Hourahine, Carol, Trager-Cowan, Marc De, Graef
Publikováno v:
Ultramicroscopy. 187
Transmission Kikuchi diffraction (TKD) has been gaining momentum as a high resolution alternative to electron back-scattered diffraction (EBSD), adding to the existing electron diffraction modalities in the scanning electron microscope (SEM). The ima
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::60fda777a71053d5c0690750d5ea8177
https://pubmed.ncbi.nlm.nih.gov/29655416
https://pubmed.ncbi.nlm.nih.gov/29655416
Autor:
M. Nouf-Allehiani, S. Vespucci, R. M. Smith, A. Alasmari, Y. Gong, Yonghao Zhang, W. Avis, Carol Trager-Cowan, Frank Mehnke, Tim Wernicke, Tao Wang, David M. Thomson, Aimo Winkelmann, L. Jiu, Philip A. Shields, M. D. Smith, Benjamin Hourahine, Gunnar Kusch, V. Kueller, Christian Kuhn, Robert W. Martin, Lucia Spasevski, Johannes Enslin, S. Hagedorn, G. Naresh-Kumar, Paul R. Edwards, Sebastian Walde, S. Kraeusel, Michael Kneissl, Marcus Weyers, Roy L. Johnston, Peter J. Parbrook, Jochen Bruckbauer, Pierre-Marie Coulon, Elena Pascal, Arne Knauer
Publikováno v:
Photonics Research
In this paper we describe the scanning electron microscopy techniques of electron backscatter diffraction, electron channeling contrast imaging, wavelength dispersive X-ray spectroscopy, and cathodoluminescence hyperspectral imaging. We present our r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2de63e87decea2c17bba84400892fe5d
https://doi.org/10.1364/prj.7.000b73
https://doi.org/10.1364/prj.7.000b73
Publikováno v:
Microscopy and Microanalysis. 23:540-541
Truly nanostructured materials pose a significant spatial resolution challenge to the conventional Electron Backscatter Diffraction (EBSD) characterization technique. Nevertheless, the interaction volume can be reduced by the use of electron transpar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1bd5d9cb5ddec07645a98ba2bf0fc8fc
https://doi.org/10.1017/s1431927617003385
https://doi.org/10.1017/s1431927617003385
Autor:
Elena Pascal, Patrick G. Callahan, Carol Trager-Cowan, Ben Hourahine, Saransh Singh, Marc De Graef
Publikováno v:
Ultramicroscopy. 188:101
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4cc15dfe1e6502b626509188678bc028
https://doi.org/10.1016/j.ultramic.2018.03.026
https://doi.org/10.1016/j.ultramic.2018.03.026