Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Elena I. Vatajelu"'
Autor:
Marco Indaco, Paolo Prinetto, Giorgio Di Natale, Elena I. Vatajelu, Lionel Torres, Mario Barbareschi
Publikováno v:
ACM Journal on Emerging Technologies in Computing Systems
ACM Journal on Emerging Technologies in Computing Systems, Association for Computing Machinery, 2016, 13 (1), ⟨10.1145/2790302⟩
ACM Journal on Emerging Technologies in Computing Systems, Association for Computing Machinery, 2016, 13 (1), ⟨10.1145/2790302⟩
Physically Unclonable Functions (PUFs) are emerging cryptographic primitives used to implement low-cost device authentication and secure secret key generation. Weak PUF s (i.e., devices able to generate a single signature or to deal with a limited nu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8ae79ad42d2ff42969ad5261d8097c30
https://doi.org/10.1145/2790302
https://doi.org/10.1145/2790302
Publikováno v:
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
DATE 2016-19th Design, Automation and Test in Europe Conference and Exhibition
DATE 2016-19th Design, Automation and Test in Europe Conference and Exhibition, Mar 2016, Dresden, Germany. pp.273-276
19th Design, Automation & Test in Europe Conference & Exhibition
DATE: Design, Automation and Test in Europe
DATE: Design, Automation and Test in Europe, Mar 2016, Dresden, Germany. pp.273-276
DATE
DATE 2016-19th Design, Automation and Test in Europe Conference and Exhibition
DATE 2016-19th Design, Automation and Test in Europe Conference and Exhibition, Mar 2016, Dresden, Germany. pp.273-276
19th Design, Automation & Test in Europe Conference & Exhibition
DATE: Design, Automation and Test in Europe
DATE: Design, Automation and Test in Europe, Mar 2016, Dresden, Germany. pp.273-276
DATE
International audience; Physically Unclonable Functions (PUFs) are emerging cryptographic primitives used to implement low-cost device authentication and secure secret key generation. Several solutions exists for classical CMOS devices/the most inves
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::74bbfe1f32c619b10ebd651548d45c11
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01374279/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01374279/document
Publikováno v:
VTS
34th IEEE VLSI Test Symposium
VTS: VLSI Test Symposium
VTS: VLSI Test Symposium, Apr 2016, Las Vegas, United States. ⟨10.1109/VTS.2016.7477292⟩
34th IEEE VLSI Test Symposium
VTS: VLSI Test Symposium
VTS: VLSI Test Symposium, Apr 2016, Las Vegas, United States. ⟨10.1109/VTS.2016.7477292⟩
International audience; The rapid development of low power, high density, high performance SoCs has pushed the embedded memories to their limits and opened the field to the development of emerging memory technologies. The Spin-Transfer-Torque Magneti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d7678ccfdaf7bd66befdeea8c3e419c5
http://hdl.handle.net/11583/2644361
http://hdl.handle.net/11583/2644361
Publikováno v:
ISVLSI: International Symposium on Very Large Scale Integration
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.467-472, ⟨10.1109/ISVLSI.2015.128⟩
ISVLSI
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.467-472, ⟨10.1109/ISVLSI.2015.128⟩
ISVLSI
International audience; Physically Unclonable Functions (PUFs) are emerging cryptographic primitives used to implement low-cost device authentication and secure secret key generation. Weak PUFs (i.e., devices able to generate a single signature or to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::517759ff50798fe84860cb12b4405b0e
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234079
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234079
Publikováno v:
DTIS
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
The CMOS based memories are facing major issues with technology scaling, such as decreased reliability and increased leakage power. A point will be reached when the technology scaling issues will overweight the benefits. For this reason, alternate so
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b6d46e42131bbf219372ee86550ebdfd
https://doi.org/10.1109/dtis.2015.7127377
https://doi.org/10.1109/dtis.2015.7127377
Publikováno v:
IDT
Due to the rapid development of hand-held electronic devices, the need for high density, low power, high performance SoCs has pushed the well-established embedded memory technologies to their limits. To overcome the existing memory issues, emerging m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::09b673a2520f133d42951e5e8bf7ebcd
http://hdl.handle.net/11583/2587978
http://hdl.handle.net/11583/2587978
Publikováno v:
IDT
In the last decade, academies and private companies have actively explored emerging memory technologies. STT-MRAM in particular is experiencing a rapid development but it is facing several challenges in terms of performance and reliability. Several t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6c94a56f6500a9cbd8fb71bb7730fe9c
https://doi.org/10.1109/idt.2014.7038589
https://doi.org/10.1109/idt.2014.7038589
Publikováno v:
ETS
Due to the rapid development of smartphones, notebooks and tablets, the need for high density, low power, high performance SoCs has pushed the well-established embedded memory technologies to their limits. To overcome the existing memory issues, emer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13f070790d5be2ad27fbc5b36173e33d
https://doi.org/10.1109/ets.2014.6847813
https://doi.org/10.1109/ets.2014.6847813
Autor:
Marco Indaco, Rosa Rodriguez-Montanes, Joan Figueras, Paolo Prinetto, S. Di Carlo, Elena I. Vatajelu
Publikováno v:
Recercat. Dipósit de la Recerca de Catalunya
Universitat Jaume I
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
DFT
Universitat Jaume I
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
DFT
In recent years, the Spin-Transfer-Torque Magnetic Random Access Memory (STT-MRAM) has emerged as a promising choice for embedded memories due to its reduced read/write latency and high CMOS integration capability. Under today aggressive technology s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e5090050ae08b63ffa15ad2b4608905
http://hdl.handle.net/11583/2571948
http://hdl.handle.net/11583/2571948
Autor:
Luigi Dilillo, A. Todri, Patrick Girard, Alberto Bosio, Elena I. Vatajelu, N. Badereddine, Arnaud Virazel
Publikováno v:
ATS: Asian Test Symposium
ATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.109-114, ⟨10.1109/ATS.2013.30⟩
Asian Test Symposium
ATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.109-114, ⟨10.1109/ATS.2013.30⟩
Asian Test Symposium
International audience; SRAM testing is becoming more and more challenging due to issues caused by continuous device scaling. Fabricated SRAMs are submitted to random and systematic process variability, which strongly affect the cell's behavior and a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37c866a694086551866ce8bdc209057b
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248609
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248609