Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Electric propertie"'
Autor:
C. Summonte, M. Canino, M. Allegrezza, M. Bellettato, A. Desalvo, R. Shukla, b, I.P. Jain, I. Crupic, S. Milita, L. Ortolani, L. LópezConesa, S. Estradé, F. Peiró, B. Garrido
Publikováno v:
Materials science & engineering. B, Solid-state materials for advanced technology 178 (2013): 551–558. doi:10.1016/j.mseb.2012.10.030
info:cnr-pdr/source/autori:C. Summonte, M. Canino, M. Allegrezza, M. Bellettato, A. Desalvo, R. Shukla,b, I.P. Jain, I. Crupic, S. Milita, L. Ortolani, L. LópezConesa, S. Estradé, F. Peiró, B. Garrido/titolo:Boron doping of silicon rich carbides: Electrical properties/doi:10.1016%2Fj.mseb.2012.10.030/rivista:Materials science & engineering. B, Solid-state materials for advanced technology/anno:2013/pagina_da:551/pagina_a:558/intervallo_pagine:551–558/volume:178
info:cnr-pdr/source/autori:C. Summonte, M. Canino, M. Allegrezza, M. Bellettato, A. Desalvo, R. Shukla,b, I.P. Jain, I. Crupic, S. Milita, L. Ortolani, L. LópezConesa, S. Estradé, F. Peiró, B. Garrido/titolo:Boron doping of silicon rich carbides: Electrical properties/doi:10.1016%2Fj.mseb.2012.10.030/rivista:Materials science & engineering. B, Solid-state materials for advanced technology/anno:2013/pagina_da:551/pagina_a:558/intervallo_pagine:551–558/volume:178
Boron doped multilayers based on silicon carbide/silicon rich carbide, aimed at the formation of silicon nanodots for photovoltaic applications, are studied. X-ray diffraction confirms the formation of crystallized Si and 3C-SiC nanodomains. Fourier
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Autor:
Armani, Francesco, Boscolo, Antonio, Bressanutti, Massimo, Feste, M. D., Piuzzi, Barbara, Zweyer, Marina
Publikováno v:
2014 IEEE 11th International Multi-Conference on Systems, Signals & Devices (SSD14).
This paper presents the design of a Scanning Near-field Optical Microscopy (SNOM) probe for the use with specimen in liquid environment. The approach is based on a first electro-mechanical characterization of existing SNOM probes. A modeling stage ha
Autor:
Francesca Simone, F.S. Ruggeri, G. Catania, Francesco Priolo, Isodiana Crupi, Francesco Ruffino, A. Grasso, A.M. Piro, Salvatore Mirabella, S. Di Marco
Publikováno v:
Thin Solid Films, 520(11), 4036-4040
Thin Solid Films 520 (2012) 11
Thin Solid Films 520 (2012) 11
We analyze the results of an extensive characterization study involving electrical and optical measurements carried out on hydrogenated amorphous silicon (α-Si:H) thin film materials fabricated under a wide range of deposition conditions. By adjusti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e79ad5a3403c813d0951602a3319ff32
http://hdl.handle.net/20.500.11769/45022
http://hdl.handle.net/20.500.11769/45022