Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Eldon N. Okazaki"'
Publikováno v:
Stray Radiation in Optical Systems II.
Many analyses are found to be simpler in direction cosine coordinates. The analyses occasionally concern data obtained at angles far from specular. In order to avoid design error, the magnitude of the difference between transformed value and measured
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::909147fc67453d1ca842e9ba7ba5b5ef
https://doi.org/10.1117/12.140709
https://doi.org/10.1117/12.140709
Autor:
John G. Kepros, Eldon N. Okazaki
Publikováno v:
Scatter from Optical Components.
The analysis of scattering test results often raises questions of whether facility or sample anisotropy is responsible for variation in data. The sample may appear macro-scopically isotropic yet, as in the case of a Si wafer, may affect results due t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b68388b501dd9140351484543f3d907e
https://doi.org/10.1117/12.962857
https://doi.org/10.1117/12.962857