Stratégie de testabilité en production des cartes électroniques à forte densité d'intégration et à signaux rapides

Autor: El Belghiti Alaoui, Nabil

Publikováno v: Micro et nanotechnologies/Microélectronique. Institut National des Sciences Appliquées de Toulouse, 2020. Français

National audience; In production test strategies are currently based on optical inspection (AOI), X-ray inspection (AXI), electrical (ICT) and functional (FT) tests.Due to the multiplication and miniaturization of electrical components, the coexisten

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______2592::4e82b874e82b6bec16f1d90f9d670030
https://hal.laas.fr/tel-03162010/document

New defect detection approach using near electromagnetic field probing for high density PCBAs New defect detection approach using near electromagnetic field probing of high density PCBAs

Autor: El Belghiti Alaoui, Nabil, Tounsi, Patrick, Boyer, Alexandre, Viard, Arnaud

Publikováno v: Microelectronics Reliability
29 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018)
29 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark. ⟨10.1016/j.microrel.2018.07.090⟩

International audience; With the density increase of today's printed circuit board assemblies (PCBA), the electronic fault detection methods reached their limits, in the same time the requirements of high reliability and robustness are greater. Indus

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3320e7d20228cfe7ff4ae3cabd169216
https://hal.laas.fr/hal-02319457