Zobrazeno 1 - 4
of 4
pro vyhledávání: '"El Badawi, Hassan"'
Autor:
El Badawi, Hassan
Publikováno v:
Traitement du signal et de l'image [eess.SP]. Université Montpellier, 2020. Français. ⟨NNT : 2020MONTS081⟩
Process variations and physical defects can degrade the performance of a circuit, or even drastically affect its operation. It is therefore essential to verify the performance of each circuit produced in order to ensure the quality of manufactured de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::97e50c9b4ced9732b1bf856dc8a85458
https://tel.archives-ouvertes.fr/tel-03360132
https://tel.archives-ouvertes.fr/tel-03360132
Autor:
El Badawi, Hassan, Azaïs, Florence, Bernard, Serge, Comte, Mariane, Kerzérho, Vincent, Lefèvre, François
Publikováno v:
European Test Symposium (ETS)
European Test Symposium (ETS), May 2020, Tallinn, Estonia
ETS 2020-IEEE European Test Symposium
ETS 2020-IEEE European Test Symposium, May 2020, Tallinn, Estonia
European Test Symposium (ETS), May 2020, Tallinn, Estonia
ETS 2020-IEEE European Test Symposium
ETS 2020-IEEE European Test Symposium, May 2020, Tallinn, Estonia
International audience; The adoption of indirect test for analog and RF integrated circuits (ICs) can tackle the rising costs of the classical industrial testing of these circuits, hence relaxing the requirements on test equipment. Based on machine-l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::dadb2cd1cdf486031ce69f607d0333a1
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03001530/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03001530/document
Autor:
El Badawi, Hassan, Azaïs, Florence, Bernard, Serge, Comte, Mariane, Kerzérho, Vincent, Lefevre, François
Publikováno v:
13ème Colloque National du GDR SoC²
13ème Colloque National du GDR SoC², Jun 2019, Montpellier, France
13ème Colloque National du GDR SoC², Jun 2019, Montpellier, France
National audience; Indirect testing of analog and RF integrated circuits is a widely studied approach, which has the benefits of relaxing requirements on test equipment and reducing industrial test cost. It is based on machine-learning algorithms to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4c7b3ff45839c3709359a2c563c9cad5
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02375900/file/GDR-SoC2-19.pdf
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02375900/file/GDR-SoC2-19.pdf
Autor:
El Badawi, Hassan, Azaïs, Florence, Bernard, Serge, Comte, Mariane, Kerzérho, Vincent, Lefèvre, François
Publikováno v:
South European Test Seminar (SETS)
South European Test Seminar (SETS), 2019, Pitztal, Austria
South European Test Seminar (SETS), 2019, Pitztal, Austria
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::b16ca3adaba003e012dd89f7573f3a97
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02375866
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02375866