Zobrazeno 1 - 10
of 126
pro vyhledávání: '"Eimori, T."'
Publikováno v:
In Microelectronic Engineering 2007 84(9):2201-2204
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B August 2005 237(1-2):72-76
Autor:
Sato, M., Umezawa, N., Shimokawa, J., Arimura, H., Sugino, S., Tachibana, A., Nakamura, M., Mise, N., Kamiyama, S., Morooka, T., Eimori, T., Shiraishi, K., Yamabe, K., Watanabe, H., Yamada, K., Aoyama, T., Nabatame, T., Nara, Y., Ohji, Y.
Publikováno v:
2008 IEEE International Electron Devices Meeting; 2008, p1-4, 4p
Publikováno v:
2008 International Conference on Simulation of Semiconductor Processes & Devices; 2008, p33-36, 4p
Autor:
Mise, N., Morooka, T., Eimori, T., Kamiyama, S., Murayama, K., Sato, M., Ono, T., Nara, Y., Ohji, Y.
Publikováno v:
2007 IEEE International Electron Devices Meeting; 2007, p527-530, 4p
Autor:
Hayashi, T., Nishida, Y., Sakashita, S., Mizutani, M., Yamanari, S., Higashi, M., Kawahara, T., Inoue, M., Yugami, J., Tsuchimoto, J., Shiga, K., Murata, N., Sayama, H., Yamashita, T., Oda, H., Kuroi, T., Eimori, T., Inoue, Y.
Publikováno v:
2006 International Electron Devices Meeting; 2006, p1-4, 4p
Publikováno v:
2006 International Conference on Simulation of Semiconductor Processes & Devices; 2006, p154-157, 4p
Publikováno v:
2006 International Conference on Simulation of Semiconductor Processes & Devices; 2006, p115-118, 4p
Autor:
Hayashi, T., Mizutani, M., Inoue, M., Yugami, J., Tsuchimoto, J., Anma, M., Komori, S., Tsukamoto, K., Tsukamoto, Y., Nii, K., Nishida, Y., Sayama, H., Yamashita, T., Oda, H., Eimori, T., Ohji, Y.
Publikováno v:
IEEE International Electron Devices Meeting, 2005. IEDM Technical Digest; 2005, p906-909, 4p
Autor:
Okagaki, T., Tanizawa, M., Fujinaga, M., Kunikiyo, T., Yuki, H., Ishikawa, K., Nishikawa, Y., Eimori, T., Inuishi, M., Oji, Y.
Publikováno v:
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005 (ICMTS 2005); 2005, p219-222, 4p