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Autor:
Dow, S., Ballweber, B., Ling-Miao Chou, Eickbusch, D., Irwin, J., Kurtzman, G., Manapragada, P., Moeller, D., Paramesh, J., Black, G., Wolischeid, R., Johnson, K.
Publikováno v:
2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315); 2002, p182-462, 281p