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Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic force micros
Externí odkaz:
http://arxiv.org/abs/2212.04678
Publikováno v:
In Ultramicroscopy January 2024 255
