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pro vyhledávání: '"Eghrari, Ali"'
Publikováno v:
The 29th Iranian Conference on Optics and Photonics (ICOP 2023)
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This paper studies
Externí odkaz:
http://arxiv.org/abs/2411.12823
Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic force micros
Externí odkaz:
http://arxiv.org/abs/2212.04678
Publikováno v:
In Ultramicroscopy January 2024 255
