Zobrazeno 1 - 10
of 73
pro vyhledávání: '"Eghbalkhah, A."'
Publikováno v:
بیولوژی کاربردی, Vol 9, Iss 34, Pp 122-133 (2019)
Aim and Background: Lactobacilli are the most well-known natural vaginal flora that helps keep the vaginal acidic environment in the presence of hydrogen peroxide enzymes. Lactobacillus destroys pathogenic bacteria in the vagina through the productio
Externí odkaz:
https://doaj.org/article/cabe79a579e34115abb9cdee5d417339
Autor:
Eghbalkhah, Behzad, Kamal, Mehdi, Afzali-Kusha, Hassan, Afzali-Kusha, Ali, Ghaznavi-Ghoushchi, Mohammad Bagher, Pedram, Massoud
Publikováno v:
In Microelectronics Reliability July 2015 55(8):1152-1162
Autor:
Kamyar Kamrani, Zahra Eskandarizadeh, Hossein Yousefimanesh, Asgar Eghbalkhah, Nahid Khosroshahi, Mojdeh Habibi Zoham
Publikováno v:
Journal of Pediatric Intensive Care. :159-162
Spinal muscular atrophy with respiratory distress type 1 (SMARD1) is a rare autosomal recessive neuromuscular disorder that involves the anterior horn motor neurons. It is a disease with a poor prognosis presenting with progressive distal motor weakn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::22dceebe1b250fc5b916209822bda07b
https://doi.org/10.1055/s-0037-1617434
https://doi.org/10.1055/s-0037-1617434
Autor:
Payman Salamati, Mousa Zargar, Asgar Eghbalkhah, Reza Chaman, Kambiz Sotoudeh, Behdad Navabi, Zahra Mokhtari
Publikováno v:
مجله دانشکده پزشکی اصفهان, Vol 28, Iss 105 (2010)
Background: This study assessed to study Pediatric Index of Mortality-2 (PIM2) measure for outcome assess-ment of children admitted to pediatric intensive care unit (PICU) of Bahrami children’s hospital. Methods: A prospective cohort study was i
Externí odkaz:
https://doaj.org/article/16bdf623e6134bd594255f96a0ac3538
Publikováno v:
Pediatric Infectious Disease. 8:34-37
Basidiobolomycosis is a rare fungal disease caused by Basidiobolus ranarum , which is an environmental saprophyte. It is a chronic inflammatory disease that is generally restricted to the subcutaneous tissue and rarely involves the gastrointestinal t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c86fac41f8a05fe5207b5ca2a87fd9a1
https://doi.org/10.1016/j.pid.2016.03.008
https://doi.org/10.1016/j.pid.2016.03.008
Autor:
Massoud Pedram, Hassan Afzali-Kusha, Mehdi Kamal, B. Eghbalkhah, Mohammad Bagher Ghaznavi-Ghoushchi, Ali Afzali-Kusha
Publikováno v:
Microelectronics Reliability. 55:1152-1162
In this work, we investigate the co-dependency of die temperature and bias temperature instability (BTI) and their combined effect on the lifetime of VLSI circuits. The investigation considers the impact of die temperature in increasing the effect of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f5d042d101d73c5deac0228801420868
https://doi.org/10.1016/j.microrel.2015.06.004
https://doi.org/10.1016/j.microrel.2015.06.004
Autor:
B. Eghbalkhah, Massoud Pedram, Mehdi Kamal, Mohammad Bagher Ghaznavi-Ghoushchi, Ali Afzali-Kusha
Publikováno v:
Microelectronics Reliability. 55:282-290
In this work, we propose a clock skew-aware aging mitigation (CSAM) technique which considers the effect of asymmetric aging both on logic path and clock tree together. Simultaneous consideration of both parts in the design optimization problem enabl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ef61167c60319c91c61d05fe84c8997
https://doi.org/10.1016/j.microrel.2014.09.033
https://doi.org/10.1016/j.microrel.2014.09.033
Publikováno v:
In Pediatric Infectious Disease January-March 2016 8(1):34-37
Publikováno v:
DTIS
This paper studies the impact of the delay degradation arising from the Negative Bias Temperature Instability (NTBI) effect on the extended instruction set architecture (ISA) and the ALU design of extensible processors. In particular, the NBTI delay
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::804ec72c13f742fd814f9e2978617fcb
https://doi.org/10.1109/dtis.2013.6527785
https://doi.org/10.1109/dtis.2013.6527785
Publikováno v:
DTIS
Reliability aware circuit design and estimation of circuit performance during lifetime is a critical challenge in design and test of integrated circuits in nanometer technology nodes. Negative Bias Temperature Instability (NBTI) as the most dominant
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::efc89daa2665fa2afb5f03cdd0920423
https://doi.org/10.1109/dtis.2013.6527796
https://doi.org/10.1109/dtis.2013.6527796