Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Edward S. Murdock"'
Autor:
Nurul Amin, James M. Daughton, A.V. Pohm, Brenda A. Everitt, Taras G. Pokhil, L. Zhong, Edward S. Murdock, T. van Nguyen, D. Olson, P. Kolbo
Publikováno v:
IEEE Transactions on Magnetics. 41:125-131
We have designed and fabricated a vertical giant magnetoresistive (VGMR) head for high-density magnetic recording. In this style of recording head, read current flows through the sensor length, which is oriented perpendicular to the air-bearing surfa
Autor:
Edward S. Murdock, Chunhong Hou, P. Kolbo, A. Goyal, Jian Chen, Insik Jin, Lei Wang, Haiwen Xi, Sining Mao, Robert M. White, Martin L. Plumer, Zheng Gao
Publikováno v:
IEEE Transactions on Magnetics. 38:26-31
We demonstrate the feasibility of a spin-valve read head using an adjacent antiferromagnetic (AFM) layer to provide a stabilization Held, eliminating the hard bias permanent magnet layer. The head stack consists of seed/AFM/CoFe/Ru/CoFe/Cu/CoFe (and/
Autor:
Eric S. Linville, Dian Song, Lei Wang, P. Kolbo, Janusz J. Nowak, Patrick J. Ryan, Douglas A. Saunders, Sining Mao, Edward S. Murdock
Publikováno v:
IEEE Transactions on Magnetics. 38:78-83
Spin tunneling recording heads above 20 Gb/in/sup 2/ have been fabricated using a bottom tunneling junction stack. The spin tunneling stack is made of Ta/PtMn/CoFe/Ru/CoFe/AlO/NiFe/Ta and stabilized by a permanent magnet abutted junction. The effecti
Publikováno v:
Journal of Applied Physics. 90:2427-2432
Electromigration-induced failures have been investigated in single layered NiFe Permalloy thin films, which are used in giant magnetoresistance (GMR) read heads in high-density magnetic recording disk drives. The time-to-failure and median-time-to-fa
Publikováno v:
IEEE Transactions on Magnetics. 39:2396-2398
Vertical giant magnetoresistive (GMR) recording head designs have been proposed to achieve the optimum bias point and magnetic stability. Using a micromagnetic model, several design options were simulated and a test feature was built to validate the
Publikováno v:
IEEE Transactions on Magnetics. 38:2655-2657
Electromigration-induced failure (EIF) lifetimes of magnetic thin films used in giant magnetoresistive (GMR) spin-valve materials have been studied to predict the fundamental electrical reliability of GMR spin-valve read head. Magnetic thin films exh
Publikováno v:
Applied Physics Letters. 79:3657-3659
The physical mechanisms responsible for the dependence of electromigration-induced failure lifetimes on NiFe thin film thickness in giant magnetoresistive spin-valve read heads have been studied to determine the maximum allowable current density. Bas
Autor:
David Q. Chen, Anthony M. Mack, Patrick J. Ryan, Edward S. Murdock, Zhenyong Zhang, Subramanian Krishnan, Eileen Yan, Giora J. Tamopolsky, Sunita Gangopadhyay, Michael L. Covault, Gary C. Rauch, Eric Champion, Rajiv Yadav Ranjan, Hans Jurgen Richter, Samuel Dacke Harkness, Yong Chang Feng
Publikováno v:
Journal of Applied Physics. 87:5407-5409
We have demonstrated 23.8 Gb/in.2 areal density using a merged read-write grant magnetoresistive head, with an oriented thin film medium tested with broadband electronics and enhanced EPR4 channels. The medium had high signal to noise ratio metrics t
Autor:
Sining Mao, Brenda A. Everitt, Jack H. Judy, Edward S. Murdock, Zhenghong Qian, John M. Sivertsen
Publikováno v:
Journal of Applied Physics. 85:6106-6108
Exchange coupling of radio frequency sputtered NiMn/NiFe (NiMn on top) and NiFe/NiMn (NiMn at bottom) bilayers have been investigated. It was found that the exchange coupling field, Hex, is not only directly related with the annealing temperature and
Publikováno v:
Applied Physics Letters. 69:3593-3595
Spin valves of film layer structure, Ta/NiMn/NiFe/Co/Cu/Co/NiFe/Ta/Substrate were fabricated by ion beam sputtering. Optimization of the processes of deposition and posthermal treatment yields highly (111) oriented spin valve films with a giant‐mag