Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Edward J. Bawolek"'
Publikováno v:
Journal of Display Technology. 10:514-520
This paper presents a new biophotonic application for large-area, high-resolution, flexible organic light-emitting diode (OLED) display technology currently used to manufacture low-cost color flexible displays on plastic substrates. The new concept u
Autor:
Scott K. Ageno, Sameer M. Venugopal, Gregory B. Raupp, Rob Naujokaitas, David R. Allee, Shawn M. O'Rourke, Michael Marrs, Edward J. Bawolek, Curt Moyer, Jesmin Haq, Dirk Bottesch, Douglas E. Loy, Jann Kaminski, Barry O'Brien, Jeff Dailey
Publikováno v:
ECS Transactions. 16:49-54
In this paper we describe solutions to effectively address critical challenges in direct fabrication of amorphous silicon thin film transistor (TFTs) arrays for active matrix flexible displays. For both metal foil and plastic flexible substrates a ma
Autor:
Joseph T. Smith, Yong Kyun Lee, Benjamin A. Katchman, Jennifer Blain Christen, Edward J. Bawolek, Sahil Shah, Barry O'Brien
Publikováno v:
BioCAS
Publikováno v:
IEEE Electron Device Letters. 29:93-95
This letter describes a method to identify the channel region of hydrogenated amorphous silicon thin film transistors (a-Si:H TFTs) in which threshold voltage(Vth) degradation occurs. The TFTs are subjected to gate bias stress under different operati
Publikováno v:
SPIE Proceedings.
A low temperature amorphous silicon (a-Si) thin film transistor (TFT) and amorphous silicon PIN photodiode technology for flexible passive pixel detector arrays has been developed using active matrix display technology. The flexible detector arrays c
Autor:
Barry O'Brien, Dirk Bottesch, Gregory B. Raupp, Curtis D. Moyer, Cynthia Bell, Edward J. Bawolek, David R. Allee, Jovan Trujillo, Sameer M. Venugopal, Rita Cordova, Michael Marrs, Douglas E. Loy
Publikováno v:
MRS Proceedings. 1287
A low temperature amorphous zinc indium oxide (ZIO) thin film transistor (TFT) backplane technology for high information content flexible organic light emitting diode (OLED) displays has been developed. We have fabricated 4.1-in. diagonal OLED backpl
Autor:
Zhiwei Li, Sameer M. Venugopal, Shawn M. O'Rourke, Edward J. Bawolek, S.G. Uppili, R. Shringarpure, H. Shivalingaiah, David R. Allee, Bryan D. Vogt, J.J. Ravindra Fernando, Lawrence T. Clark, Korhan Kaftanoglu
Publikováno v:
IEEE Transactions on Electron Devices.
This paper reviews amorphous silicon thin-film-transistor (TFT) degradation with electrical stress, examining the implications for various types of circuitry. Experimental measurements on active-matrix backplanes, integrated a-Si:H column drivers, an
Autor:
R. Shringarpure, Zheng Li, Sameer M. Venugopal, Lawrence T. Clark, David R. Allee, Edward J. Bawolek
Publikováno v:
2008 IEEE International Reliability Physics Symposium.
Amorphous silicon thin film transistors degrade with electrical stress. In particular, the threshold voltage increases significantly with positive gate voltages. The characteristics and mechanisms of the degradation are reviewed. The implications for
Autor:
Gregory B. Raupp, David R. Allee, Curt Moyer, Shawn M. O¡¯Rourke, Jovan Trujillo, Sameer M. Venugopal, Barry O'Brien, Dirk Bottesch, Douglas E. Loy, Edward J. Bawolek, Michael Marrs, Scott K. Ageno, Jann Kaminski, Rita Cordova, Jeff Dailey
Publikováno v:
MRS Proceedings. 1030
Principal challenges to direct fabrication of high performance a-Si:H transistor arrays on flexible substrates include automated handling through bonding-debonding processes, substrate-compatible low temperature fabrication processes, management of d