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pro vyhledávání: '"Edward Cole, Jr"'
Autor:
Edward Cole, Jr
Publikováno v:
Proposed for presentation at the NSF Workshop on Future of Semiconductors and Beyond - Microsystem Integration Panel held February 17, 2021 in Virtual, Virtual..
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::384ecd601b3315a79f1fdc975e22f0bf
https://doi.org/10.2172/1848033
https://doi.org/10.2172/1848033
Autor:
Zhiyong Wang1 zhiyong.wang@maximintegrated.com
Publikováno v:
Electronic Device Failure Analysis. Feb2019, Vol. 21 Issue 1, p46-47. 2p.
Publikováno v:
2008 IEEE International Test Conference; 2008, p19-24, 6p
Publikováno v:
2004 International Conference on Test; 2004, p17-22, 6p
Publikováno v:
2007 IEEE International Integrated Reliability Workshop Final Report; 2007, p161-163, 3p
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate
Based on a long series of will abstracts that appeared over a period of 45 years in'The New England Historical and Genealogical Register', this work encompasses what amounts to the first 30 years or so of the Suffolk County, Massachusetts, estate rec