Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Edward Charn"'
Autor:
Tzu-Nien Lee, John-H Lau, Cheng-Ta Ko, Tim Xia, Eagle Lin, Kai-Ming Yang, Puru-Bruce Lin, Chia-Yu Peng, Leo Chang, Jia-Shiang Chen, Yi-Hsiu Fang, Li-Yueh Liao, Edward Charn, Jason Wang, Tzyy-Jang Tseng
Publikováno v:
Materials, Vol 15, Iss 7, p 2396 (2022)
In this study, the Df (dissipation factor or loss tangent) and Dk (dielectric constant or permittivity) of the low-loss dielectric material from three different vendors are measured by the Fabry–Perot open resonator (FPOR) technique. Emphasis is pl
Externí odkaz:
https://doaj.org/article/a7325ed4b3bb49e9871dd6caee5ba862
Autor:
Tzu Nien Lee, John H Lau, Cheng-Ta Ko, Tim Xia, Eagle Lin, Henry Kai-Ming Yang, Puru Bruce Lin, Tony Chia-Yu Peng, Leo Chang, Jia Shiang Chen, Yi-Hsiu Fang, Li-Yueh Liao, Edward Charn, Jason Wang, Tzyy-Jang Tseng
Publikováno v:
2021 IEEE CPMT Symposium Japan (ICSJ).
Publikováno v:
2018 IEEE 20th Electronics Packaging Technology Conference (EPTC).
As the electronic devices getting lighter and smaller, a coreless substrate technology, called Embedded Trace Substrate (ETS) is developed to meet the market requirement. However, this design causes severe warpage due to the large difference in CTE (