Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Edmundo Gutierrez-D"'
Autor:
Alan Otero-Carrascal, Dora Chaparro-Ortiz, Purushothaman Srinivasan, Oscar Huerta, Edmundo Gutiérrez-Domínguez, Reydezel Torres-Torres
Publikováno v:
Micromachines, Vol 15, Iss 2, p 252 (2024)
Based on S-parameter measurements, the effect of dynamic trapping and de-trapping of charge in the gate oxide, the increase of dielectric loss due to polarization, and the impact of leakage current on the small-signal input impedance at RF is analyze
Externí odkaz:
https://doaj.org/article/a5d4baa581cf400899f75e7c6b4c8d95
Autor:
Miguel Castro-L, F. Javier De la Hidalga-W, Pedro Rosales-Q, Alfonso Torres-J, Wilfrido Calleja-A, Edmundo Gutierrez-D, Don L. Kendall
Publikováno v:
ECS Meeting Abstracts. :16-16
not Available.
Autor:
Miguel Castro-L, F. Javier De la Hidalga-W, Pedro Rosales-Q, Alfonso Torres-J, Wilfrido Calleja-A, Edmundo Gutierrez-D, Don L. Kendall
Publikováno v:
ECS Meeting Abstracts. :17-17
not Available.