Zobrazeno 1 - 10
of 91
pro vyhledávání: '"Edgar F. Rauch"'
Autor:
Nicolas Folastre, Junhao Cao, Gozde Oney, Sunkyu Park, Arash Jamali, Christian Masquelier, Laurence Croguennec, Muriel Veron, Edgar F. Rauch, Arnaud Demortière
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-15 (2024)
Abstract The technique known as 4D-STEM has recently emerged as a powerful tool for the local characterization of crystalline structures in materials, such as cathode materials for Li-ion batteries or perovskite materials for photovoltaics. However,
Externí odkaz:
https://doaj.org/article/95e3a57d266d407eb77abf82513eee54
Autor:
Arthur Després, Stoichko Antonov, Charlotte Mayer, Muriel Veron, Edgar F. Rauch, Catherine Tassin, Jean-Jacques Blandin, Paraskevas Kontis, Guilhem Martin
Publikováno v:
Additive Manufacturing Letters, Vol 1, Iss , Pp 100011- (2021)
Minor addition of zirconium is common in polycrystalline nickel-based superalloys, where it is believed that it segregates at grain boundaries and contributes to increase the creep resistance. However, in superalloys produced by additive manufacturin
Externí odkaz:
https://doaj.org/article/b8d0ff98face4af887ca4a10bd97f41a
Autor:
Stavros Nicolopoulos, Partha P. Das, Pablo J. Bereciartua, Fotini Karavasili, Nikolaos Zacharias, Alejandro Gómez Pérez, Athanassios S. Galanis, Edgar F. Rauch, Raúl Arenal, Joaquim Portillo, Josep Roqué-Rosell, Maria Kollia, Irene Margiolaki
Publikováno v:
Heritage Science, Vol 6, Iss 1, Pp 1-12 (2018)
Abstract We present new transmission electron microscopy (TEM) based electron diffraction characterization techniques (orientation imaging combined with 3D precession electron diffraction tomography-ADT) applied on cultural heritage materials. We hav
Externí odkaz:
https://doaj.org/article/f26ab2497987447d84db926fd7dc293f
Publikováno v:
Symmetry, Vol 13, Iss 12, p 2339 (2021)
The authors wish to make the following corrections to this paper [...]
Externí odkaz:
https://doaj.org/article/bf5db3e59b644feea250e1ad3dcc4a44
Publikováno v:
Symmetry, Vol 13, Iss 9, p 1675 (2021)
ACOM/TEM is an automated electron diffraction pattern indexing tool that enables the structure, phase and crystallographic orientation of materials to be routinely determined. The software package, which is part of ACOM/TEM, has substantially evolved
Externí odkaz:
https://doaj.org/article/e49f92923ad74313985f5918a106faf7
Autor:
Maxence Buttard, Guilhem Martin, Patrick Harrison, Edgar F. Rauch, Béchir Chéhab, Philippe Jarry, Jean-Jacques Blandin, Patricia Donnadieu
Publikováno v:
Scripta Materialia. 226:115212
Autor:
Pierre Schutz, Frantz Martin, Frantz Auzoux, Jamila Adem, Edgar F. Rauch, Yves Wouters, L. Latu-Romain
Publikováno v:
SSRN Electronic Journal.
Autor:
Maxence Buttard, Guilhem Martin, Patrick Harrison, Edgar F. Rauch, Béchir Chehab, Philippe Jarry, Jean-Jacques Blandin, Patricia Donnadieu
Publikováno v:
SSRN Electronic Journal.
Autor:
Edgar F. Rauch, Charlotte Mayer, Stoichko Antonov, Guilhem Martin, Jean-Jacques Blandin, Muriel Véron, Catherine Tassin, Paraskevas Kontis, Arthur Despres
Publikováno v:
Additive Manufacturing Letters
Additive Manufacturing Letters, 2021, 1, pp.100011. ⟨10.1016/j.addlet.2021.100011⟩
Additive Manufacturing Letters, Vol 1, Iss, Pp 100011-(2021)
Additive Manufacturing Letters, 2021, 1, pp.100011. ⟨10.1016/j.addlet.2021.100011⟩
Additive Manufacturing Letters, Vol 1, Iss, Pp 100011-(2021)
Minor addition of zirconium is common in polycrystalline nickel-based superalloys, where it is believed that it segregates at grain boundaries and contributes to increase the creep resistance. However, in superalloys produced by additive manufacturin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d0d0f8cd4429df38f45c43e5ebd71b05
https://hdl.handle.net/21.11116/0000-000A-0737-121.11116/0000-000A-0739-F
https://hdl.handle.net/21.11116/0000-000A-0737-121.11116/0000-000A-0739-F
Autor:
Patrick Harrison, Xuyang Zhou, Saurabh Mohan Das, Pierre Lhuissier, Christian H. Liebscher, Michael Herbig, Wolfgang Ludwig, Edgar F. Rauch
Publikováno v:
Ultramicroscopy. 238:113536
The properties of polycrystalline materials are related to their microstructures and hence a complete description, including size, shape, and orientation of the grains, is necessary to understand the behavior of materials. Here, we use Scanning Prece