Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Edgar Cruz‐Valeriano"'
Autor:
José Manuel Juárez-García, Jorge Morales-Hernández, Aime Gutiérrez-Peralta, Edgar Cruz-Valeriano, Rafael Ramírez-Bon, José M. Yañez Limón
Publikováno v:
Revista de Metalurgia, Vol 58, Iss 4 (2022)
This study presents the synthesis and characterization of TiN hard coatings as a candidate reference material for surface metrology in chemistry. TiN coatings were grown on a silicon wafer with (111) orientation using dc reactive magnetron sputtering
Externí odkaz:
https://doaj.org/article/8eba01b4443b4cd39d6d71cb532e620b
Autor:
Eduardo A. Murillo‐Bracamontes, Juan J. Gervacio‐Arciniega, Edgar Cruz‐Valeriano, Christian I. Enríquez‐Flores, Martha A. Palomino‐Ovando, José M. Yañez‐Limón, Jesús M. Siqueiros, M. Paz Cruz
Publikováno v:
IET Science, Measurement & Technology, Vol 15, Iss 5, Pp 419-426 (2021)
Abstract Local characterizations of electric, magnetic, mechanical, electrochemical, and structural properties of materials by scanning probe microscopy (SPM) can be carried out by sensing variations of the contact cantilever's resonance frequencies,
Externí odkaz:
https://doaj.org/article/10e6c010ccaa497bb782f6ad5ea5b83f
Autor:
Aime M Gutiérrez-Peralta, Edgar Cruz-Valeriano, Carlos Ávila-Herrera, Christian I Enríquez Flores, Gustavo Zambrano, Jorge Morales-Hernández, Joel Moreno Palmerin, José M Yañez-Limón
Publikováno v:
Materials Research Express, Vol 7, Iss 11, p 116411 (2020)
This work documents the study of samples of CN _x /MoS _2 multilayer coatings, deposited by magnetron sputtering technique, using 10% and 16% of N _2 concentration in the Ar/N _2 gas mixture to obtain two sample sets with different nitrogen concentra
Externí odkaz:
https://doaj.org/article/013b9716b7d0421eb976894777da1f4f
Autor:
Edgar Cruz Valeriano, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, Susana Meraz Dávila, Joel Moreno Palmerin, Martín Adelaido Hernández Landaverde, Yuri Lizbeth Chipatecua Godoy, Aime Margarita Gutiérrez Peralta, Rafael Ramírez Bon, José Martín Yañez Limón
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 703-716 (2020)
In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of
Externí odkaz:
https://doaj.org/article/fe1ec93eaec243fcac3e177789c1c51a
Autor:
Martín Adelaido Hernández Landaverde, José Juan Gervacio Arciniega, Aime Margarita Gutiérrez Peralta, Edgar Cruz Valeriano, Yuri Lizbeth Chipatecua Godoy, Susana Meraz Davila, José Martín Yáñez Limón, Joel Moreno Palmerin, Christian Iván Enriquez Flores, Rafael Ramírez Bon
Publikováno v:
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 703-716 (2020)
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 703-716 (2020)
In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3062a451ffad3f75cf3dac2604667a1c
http://europepmc.org/articles/PMC7214876
http://europepmc.org/articles/PMC7214876