Neural network analysis of neutron and X-ray reflectivity data: automated analysis using mlreflect, experimental errors and feature engineering

Autor: Greco, Alessandro, Starostin, Vladimir, Edel, Evelyn, Munteanu, Valentin, Russegger, Nadine, Dax, Ingrid, Shen, Chen, Bertram, Florian, Hinderhofer, Alexander, Gerlach, Alexander, Schreiber, Frank

This work demonstrates the Python package mlreflect which implements an optimized pipeline for the automized analysis of reflectometry data using machine learning. The package combines several training and data treatment techniques discussed in previ

Externí odkaz: http://arxiv.org/abs/2202.11609

Neural network analysis of neutron and X-ray reflectivity data: automated analysis using mlreflect , experimental errors and feature engineering.

Autor: Greco A; Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany., Starostin V; Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany., Edel E; Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany., Munteanu V; Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany., Rußegger N; Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany., Dax I; Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany., Shen C; Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany., Bertram F; Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany., Hinderhofer A; Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany., Gerlach A; Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany., Schreiber F; Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany.

Publikováno v: Journal of applied crystallography [J Appl Crystallogr] 2022 Apr 02; Vol. 55 (Pt 2), pp. 362-369. Date of Electronic Publication: 2022 Apr 02 (Print Publication: 2022).