Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Eddy, Chip R."'
Site Specific TEM Specimen Preparation for Characterization of Extended Defects in 4H-SiC Epilayers.
Autor:
Abadier, Mina, Myers-Ward, Rachael L., Song, Haizheng, Kurt Gaskill, D., Eddy, Chip R., Sudarshan, Tangali S., Picard, Yoosuf N., Skowronski, Marek
Publikováno v:
Microscopy & Microanalysis; Aug2014 Supplement, Vol. 20 Issue S3, p344-345, 2p
