Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Ed G. Rightor"'
Autor:
Ed G. Rightor, Cathy L. Tway
Publikováno v:
Catalysis Today. 258:226-229
Current transitions in the global chemical and petrochemical industries provide a unique opportunity to reduce the energy and emissions footprint per unit of production as more efficient technology is brought on-line. They also provide an opening for
Autor:
Kelvin Lester, Abhaya K. Datye, Robert J. Gulotty, Michael G. Smith, Wendy Waterman, Hugo Zea, Ed G. Rightor
Publikováno v:
Applied Catalysis A: General. 282:237-245
Hydrogenation of acetylene–ethylene mixtures was studied on Pd/SiO2 and Pd–Ag/SiO2 under conditions that correspond to “front-end” hydrogenation of acetylene. The presence of excess H2 under “front-end” hydrogenation conditions can lead t
Autor:
Adam P. Hitchcock, Bruce Harteneck, Erik H. Anderson, Harald Ade, Ed G. Rightor, Tony Warwick, Peter Hitchcock, Tolek Tyliszczak, G. E. Mitchell, A. L. D. Kilcoyne
Publikováno v:
Journal de Physique IV (Proceedings). 104:3-8
During the last two decades, scanning transmission x-ray microscopy (STXM) has evolved into a powerful characterization tool. For best performance, STXM's are located at undulator sources at synchrotron facilities. The scarcity and expense of undulat
Autor:
Harald Ade, G. E. Mitchell, W. F. Steele, L. Yang, A. L. D. Kilcoyne, Erik H. Anderson, Ed G. Rightor, Tony Warwick, Adam P. Hitchcock, P. Hitchcock, Sirine C. Fakra, Bruce Harteneck, Tolek Tyliszczak, K. Franck
Publikováno v:
Journal of Synchrotron Radiation. 10:125-136
Two new soft X-ray scanning transmission microscopes located at the Advanced Light Source (ALS) have been designed, built and commissioned. Interferometer control implemented in both microscopes allows the precise measurement of the transverse positi
Publikováno v:
Journal of Polymer Science Part B: Polymer Physics. 41:258-268
The morphological features of three flexible slabstock polyurethane foams based on varied contents of 2,4 and 2,6 toluene diisocyanate (TDI) isomers are investigated. The three commercially available TDI mixtures, that is, 65:35 2,4/2,6 TDI, 80:20 2,
Autor:
Joe Maj, Abhaya K. Datye, Ed G. Rightor, J Blackson, Robert J. Gulotty, Michael G. Smith, Yaming Jin, Wendy Waterman, Michael T. Holbrook
Publikováno v:
Journal of Catalysis. 203:292-306
Structural changes were induced in Pd and Pd–Ag catalysts by oxidation and reduction. The influence of oxidative restructuring on the selectivity for acetylene hydrogenation to ethylene was studied under conditions of industrial significance (acety
Publikováno v:
Quality Engineering. 12:425-438
[This abstract is based on the author's abstract.] In the plastic or polymer product field, researchers often investigate processing and additive effects on polymer material properties in order to improve product performance. Polymer performance i..
Autor:
Lidy Werner A, Ed G. Rightor, Adam P. Hitchcock, Stephen G. Urquhart, G. E. Mitchell, Harald Ade, A. P. Smith
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 100:119-135
The successful application of X-ray spectromicroscopy to chemical analysis of polymers is reviewed and a detailed application to quantitative analysis of polyurethanes is presented. Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is t
Publikováno v:
Quality Engineering. 12:89-96
A case study is presented from polyurethane product research. It demonstrates the need for true replicate samples when sample-to-sample variation is not known. A first-pass analysis of an additive effect on a particular polyurethane microstructure wa
Autor:
Hyun-Joon Shin, S. Cerasari, Shinjiro Hayakawa, Harald Ade, Adam P. Hitchcock, T. Warwick, Ed G. Rightor, M. Moronne, Brian P. Tonner, K. Franck, Jonathan D. Denlinger, Adrián Luis García García, W. F. Steele, Satish Chandra Babu Myneni, Tolek Tyliszczak, Eli Rotenberg, J. Kikuma, G. Meigs, S. Seal, Jeffrey B. Kortright
Publikováno v:
Review of Scientific Instruments. 69:2964-2973
Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5