Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Ebru Apak"'
Autor:
Jonathan E. Spanier, Siu-Wai Chan, Qiang Jin, Richard D. Robinson, Irving P. Herman, Ebru Apak, Feng Zhang
Publikováno v:
Applied Physics Letters. 80:127-129
Nanoparticles of cerium oxide with a narrow size distribution (±15%) are prepared by mixing cerium nitrate solution with an ammonium reagent. High-resolution transmission electron microscopy (TEM) indicates that over 99% of the synthesized particles
Publikováno v:
SPIE Proceedings.
Optical Critical Dimension (OCD) measurements using Normal-Incidence Spectroscopic Polarized Reflectance and Ellipsometry allows for the separation of transverse electric and transverse magnetic modes of light reflected from an anisotropic sample as
Autor:
Ray Hoobler, Ebru Apak
Publikováno v:
SPIE Proceedings.
Optical Critical Dimension (OCD) measurements using Normal-Incidence Spectroscopic Ellipsometry (polarized reflectance) allow for the separation of transverse electric and transverse magnetic modes of light reflected from an anisotropic sample as fou
Autor:
Kumar, Sumeet, Ojha, Animesh K.
Publikováno v:
AIP Advances; May2013, Vol. 3 Issue 5, p052109, 6p
Autor:
Zhang, Feng, Chan, Siu-Wai, Spanier, Jonathan E., Apak, Ebru, Jin, Qiang, Robinson, Richard D., Herman, Irving P.
Publikováno v:
Applied Physics Letters; 1/7/2002, Vol. 80 Issue 1, p127, 3p, 1 Diagram, 5 Graphs
Autor:
Watson, David B.
Ruthenium compounds constitute a versatile class of catalysts for important synthetic transformations in organic chemistry. The ability of ruthenium to access different oxidation states and to accommodate a large variety of ligands in various coordin
Autor:
Syed Rizvi
As the semiconductor industry attempts to increase the number of functions that will fit into the smallest space on a chip, it becomes increasingly important for new technologies to keep apace with these demands. Photomask technology is one of the ke