Zobrazeno 1 - 10
of 75
pro vyhledávání: '"Eberlein, D."'
Autor:
Heinrich, M., Kutter, C., Basler, F., Mittag, M., Alanis, L.E., Eberlein, D., Schmid, A., Reise, C., Kroyer, T., Neuhaus, D.H., Wirth, H.
37th European Photovoltaic Solar Energy Conference and Exhibition; 1695-1700
We provide a general overview on vehicle integrated photovoltaics (VIPV) for passenger cars. Historic examples are reviewed to demonstrate that VIPV can provide an econ
We provide a general overview on vehicle integrated photovoltaics (VIPV) for passenger cars. Historic examples are reviewed to demonstrate that VIPV can provide an econ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::25e85e7c97490fcd13d30e81d991be2e
Autor:
Nagel, H., Gledhill, S., Kroyer, T., Eberlein, D., Kraft, A., Fischer, T., Hain, A., Wohlfart, P., Glatthaar, M., Glunz, S.W.
37th European Photovoltaic Solar Energy Conference and Exhibition; 861-866
Several high-efficiency solar cell types, such as tunnel oxide passivated contact and SunPower’s interdigitaded back contact cells, benefit from physical vapour deposit
Several high-efficiency solar cell types, such as tunnel oxide passivated contact and SunPower’s interdigitaded back contact cells, benefit from physical vapour deposit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69c50e2e3883ae56ee557fe5395619a3
36th European Photovoltaic Solar Energy Conference and Exhibition; 229-234
Interconnection of silicon heterojunction (SHJ) solar cells by soldering is challenging due to the temperature sensitivity of the passivation layers. Within our study, we
Interconnection of silicon heterojunction (SHJ) solar cells by soldering is challenging due to the temperature sensitivity of the passivation layers. Within our study, we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cdbc37d9dd69cd9aff204f1fc34486d3
36th European Photovoltaic Solar Energy Conference and Exhibition; 995-999
Temperature changes in the field (day-night changes and seasons) can affect the performance of photovoltaic modules. Standard IEC 61215 temperature cycling (TC) tests emu
Temperature changes in the field (day-night changes and seasons) can affect the performance of photovoltaic modules. Standard IEC 61215 temperature cycling (TC) tests emu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f5c57742cf3d56578d2fc0b01f4565e4
Autor:
Zhou, T., König, M., Henning, A., Hanselmann, D., Hoffmann, S., Pitta Bauermann, L., Fokuhl, E., Eberlein, D., Kraft, A., Eitner, U., Pranger, W., Schütz, A.
35th European Photovoltaic Solar Energy Conference and Exhibition; 1223-1226
Crystalline silicon solar cells are usually interconnected by solder-coated copper ribbons which are soldered onto the busbars of the front side metallization and the r
Crystalline silicon solar cells are usually interconnected by solder-coated copper ribbons which are soldered onto the busbars of the front side metallization and the r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78efe724171577e7215e11c02ed62126
Autor:
Nagel, H., Eberlein, D., Hoffmann, S., Graf, M., Steinhauser, B., Feldmann, F., Kraft, A., Eitner, U., Glatthaar, M., Hermle, M., Glunz, S.W., Haverkamp, H., Fischer, T., Hain, A., Wohlfart, P., Mertens, V., Müller, J.M., Buck, T.
33rd European Photovoltaic Solar Energy Conference and Exhibition; 295-299
We investigated ultrasonic tinning of physical vapor deposited (PVD) Al rear contacts on p-type passivated emitter and rear cells and n-type back junction cells, respecti
We investigated ultrasonic tinning of physical vapor deposited (PVD) Al rear contacts on p-type passivated emitter and rear cells and n-type back junction cells, respecti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e9c739cb8528d5061146b1c94056372
32nd European Photovoltaic Solar Energy Conference and Exhibition; 48-52
Results of an electroless displacement process for the deposition of inexpensive solderable metal on physical vapour deposited (PVD) aluminum are presented. The dip – rin
Results of an electroless displacement process for the deposition of inexpensive solderable metal on physical vapour deposited (PVD) aluminum are presented. The dip – rin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fbe63124fcb58134019d4b28f4337d7d
Since passivated emitter and rear cells (PERC) and other silicon solar cell concepts with evaporated aluminum (Al) as rear metallization are incompatible with a common solder process, in this work an annealing stable,solderable and long-term stable m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::43ffdd2145b672a06686fbed7e87b93e
https://publica.fraunhofer.de/handle/publica/241509
https://publica.fraunhofer.de/handle/publica/241509
29th European Photovoltaic Solar Energy Conference and Exhibition; 532-535
In this work we present our latest results using aluminium foil as rear side metallization for solar cells with dielectric passivation and laser fired contacts (LFC). Bes
In this work we present our latest results using aluminium foil as rear side metallization for solar cells with dielectric passivation and laser fired contacts (LFC). Bes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::59c05ff411fcf9ea36524aa817339962
Autor:
Bay, N., Horzel, J., Passig, M., Sieber, M., Burschik, J., Kühnlein, H., Bartsch, J., Brand, A., Mondon, A., Eberlein, D., Völker, C., Gutscher, S., Letize, A., Lee, B., Weber, D., Böhme, R.
29th European Photovoltaic Solar Energy Conference and Exhibition; 1272-1276
Replacing Ag paste contacts in silicon solar cells by plated Ni/Cu contacts seems a logical next step in the evolution of industrial Si solar cell manufacturing. Ag pas
Replacing Ag paste contacts in silicon solar cells by plated Ni/Cu contacts seems a logical next step in the evolution of industrial Si solar cell manufacturing. Ag pas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91a4ef5e8cf395c6b8eb8e0d72ca4bb5