Zobrazeno 1 - 10
of 961
pro vyhledávání: '"Eastman, L.F."'
Publikováno v:
In Microelectronics Journal March 2009 40(3):410-412
Autor:
Wang, Z., Reimann, K., Woerner, M., Elsaesser, T., Hofstetter, D., Hwang, J., Schaff, W.J., Eastman, L.F.
Publikováno v:
In Physica E: Low-dimensional Systems and Nanostructures 2006 32(1):562-565
Autor:
Krischok, S., Yanev, V., Balykov, O., Himmerlich, M., Schaefer, J.A., Kosiba, R., Ecke, G., Cimalla, I., Cimalla, V., Ambacher, O., Lu, H., Schaff, W.J., Eastman, L.F.
Publikováno v:
In Surface Science 2004 566 Part 2:849-855
Autor:
Danylyuk, S.V. ∗, Vitusevich, S.A., Podor, B., Belyaev, A.E., Avksentyev, A.Yu., Tilak, V., Smart, J., Vertiatchikh, A., Eastman, L.F.
Publikováno v:
In Microelectronics Journal May-August 2003 34(5-8):575-577
Autor:
Brillson, L.J., Bradley, S.T., Goss, S.H., Sun, X., Murphy, M.J., Schaff, W.J., Eastman, L.F., Look, D.C., Molnar, R.J., Ponce, F.A., Ikeo, N., Sakai, Y.
Publikováno v:
In Applied Surface Science 2002 190(1):498-507
Autor:
Brillson, L.J *, Young, A.P, Jessen, G.H, Levin, T.M, Bradley, S.T, Goss, S.H, Bae, J, Ponce, F.A, Murphy, M.J, Schaff, W.J, Eastman, L.F
Publikováno v:
In Applied Surface Science 15 May 2001 175-176:442-449
Autor:
Dimitrov, R *, Tilak, V, Yeo, W, Green, B, Kim, H, Smart, J, Chumbes, E, Shealy, J.R, Schaff, W, Eastman, L.F, Miskys, C, Ambacher, O, Stutzmann, M
Publikováno v:
In Solid State Electronics 2000 44(8):1361-1365
Publikováno v:
Journal of Applied Physics; 12/1/2004, Vol. 96 Issue 11, p6439-6444, 6p, 8 Graphs
Publikováno v:
Journal of Applied Physics; 9/15/2003, Vol. 94 Issue 6, p3972, 7p, 1 Diagram, 5 Charts, 5 Graphs
Autor:
Baumann, E., Giorgetta, F.R., Hofstetter, D., Wu, H., Schaff, W.J., Eastman, L.F., Kirste, L.
We report on intersubband absorption and photovoltage measurements on regular GaN/AlN-based superlattice structures at 1.55 µm. For high barriers, the photovoltage peaks at a higher energy than the absorbance spectrum due to the decrease of the tunn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::f6f421bfc2094b9f2fcfc4504a961b65
https://publica.fraunhofer.de/handle/publica/209867
https://publica.fraunhofer.de/handle/publica/209867
