Zobrazeno 1 - 2
of 2
pro vyhledávání: '"EWI-22587"'
Publikováno v:
23rd Micromechanics and Microsystems Europe Workshop, MME 2012
We present a improvement of our previous design of wireframe tips for scanning Hall probes. By doubling the separation between electrode structures and cantilever base, the yield could be raised from less than 10% to over 75%. To avoid build up of st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=narcis______::cc26d3eaa32b51811360ae96e1b6711f
https://research.utwente.nl/en/publications/full-siliconnitride-probes-with-corner-lithography-wireframes-for-scanning-hall-probe-microscopy(7d7bb5f8-fc62-42f9-9a98-c54a9d7a108b).html
https://research.utwente.nl/en/publications/full-siliconnitride-probes-with-corner-lithography-wireframes-for-scanning-hall-probe-microscopy(7d7bb5f8-fc62-42f9-9a98-c54a9d7a108b).html
We present a improvement of our previous design of wireframe tips for scanning Hall probes. By doubling the separation between electrode structures and cantilever base, the yield could be raised from less than 10% to over 75%. To avoid build up of st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dris___00893::0e6f041a4e7eed09ab5d67a7d1240bc7
http://eprints.eemcs.utwente.nl/secure2/22587/01/11949Hatakeyama-20120705-abstract.pdf
http://eprints.eemcs.utwente.nl/secure2/22587/01/11949Hatakeyama-20120705-abstract.pdf