Zobrazeno 1 - 1
of 1
pro vyhledávání: '"EWI-17048"'
Publikováno v:
IEEE transactions on dependable and secure computing, 7(2), 128-143. IEEE
Fault trees (FT) are among the most prominent formalisms for reliability analysis of technical systems. Dynamic FTs extend FTs with support for expressing dynamic dependencies among components. The standard analysis vehicle for DFTs is state-based, a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a356d57a2b5955433ef66787564fe5d8
https://doi.org/10.1109/tdsc.2009.45
https://doi.org/10.1109/tdsc.2009.45
