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Autor:
Kuindersma, P., Hoang, T., Schmitz, Jurriaan, Vijayaraghavan, M.N., Dijkstra, Mindert, Dijkstra, M., van Noort, W.A., Vanhoucke, T., Peters, W.C.M., Kramer, M.C.J.C.M.
Publikováno v:
5th IEEE International Conference on Group IV Photonics, 2008, 256-258
STARTPAGE=256;ENDPAGE=258;TITLE=5th IEEE International Conference on Group IV Photonics, 2008
STARTPAGE=256;ENDPAGE=258;TITLE=5th IEEE International Conference on Group IV Photonics, 2008
We present experimental and theoretical proof for a single and unique relationship between the breakdown voltage and power efficiency of visible light emitting devices fabricated in standard BiCMOS processes.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::250d6c1b2d8d464f6042a7ecd6122f2f
https://research.utwente.nl/en/publications/e9020176-ac89-4af1-a4a2-77fbebb1e841
https://research.utwente.nl/en/publications/e9020176-ac89-4af1-a4a2-77fbebb1e841