Zobrazeno 1 - 10
of 95
pro vyhledávání: '"ERKOVAN, Mustafa"'
Autor:
Choudhury, Vishal, Khandekar, Chinmay, Boddeti, Ashwin K., Jishi, Ali, Erkovan, Mustafa, Sentz, Tyler, Kalhor, Farid, Cardoso, Susana, Supradeepa, V. R., Jacob, Zubin
Characterizing the optical response of magneto-optic and magnetic materials usually relies on semi-classical models (e.g. Lorentz oscillator model) involving few parameters or models based on a detailed quantum mechanical description of the underlyin
Externí odkaz:
http://arxiv.org/abs/2402.11646
Akademický článek
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Publikováno v:
In Journal of Alloys and Compounds 5 February 2022 892
Autor:
Koç, Mümin Mehmet, Dere, Ayşegül, Özdere, Alper, Al-Sehemi, Abdullah G., Coşkun, Burhan, Al-Ghamdi, Ahmed A., Erkovan, Mustafa, Yakuphanoğlu, Fahrettin
Publikováno v:
In Journal of Molecular Structure 15 December 2021 1246
Akademický článek
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We experimentally investigated disordered PtxCo1-x (here x: 0.4, 0.5 and 0.6) alloy thin films magnetic properties which depended on Pt content. The magnetic properties of PtCo films were described with two effects, one of them is the hybridization b
Externí odkaz:
http://arxiv.org/abs/1401.0227
Autor:
Demirci, Erdem, Öztürk, Mustafa, Sınır, Ekrem, Ulucan, Utku, Akdoğan, Numan, Öztürk, Osman, Erkovan, Mustafa
Temperature and PtCo composition dependence of exchange bias in PtxCo1-x/CoO bilayers is investigated. It is observed that exchange bias properties, blocking temperature and magnetic anisotropy of the PtxCo1-x/CoO thin films are strongly affected by
Externí odkaz:
http://arxiv.org/abs/1308.0483
Autor:
Alpaslan Kösemen, Zühal, Kösemen, Arif, Öztürk, Sadullah, Canımkurbey, Betül, Erkovan, Mustafa, Yerli, Yusuf
Publikováno v:
In Thin Solid Films 28 February 2019 672:90-99
Autor:
Koç, Mümin Mehmet, Aslan, Naim, Erkovan, Mustafa, Aksakal, Bünyamin, Uzun, Orhan, Farooq, W. Aslam, Yakuphanoğlu, Fahrettin
Publikováno v:
In Optik February 2019 178:316-326
Autor:
Erkovan, Mustafa
Different thicknesses of cobalt thin films were growth by magnetron sputtering deposition techniques. The films thicknesses were determinated with X ray Photoelectron Spectroscopy (XPS) and Quartz Crystal Monitoring (QCM). XPS is also used to determi
Externí odkaz:
http://arxiv.org/abs/0910.5452