Výsledky vyhledávání - "EM susceptibility"

Conception de sources optoélectroniques transitoires à formes d'ondes maitrisées

Autor: Reineix, Gwenaël

Publikováno v: Electronique. Université de Limoges, 2020. Français. ⟨NNT : 2020LIMO0011⟩

The work developed in this thesis focuses on two main applications : the generation of signals dedicated to electromagnetic susceptibility tests and the shaping of transient signals applied to spectral shaping for impulse radars. For susceptibility t

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::89ade147d1d335a2b1c62cf13daec094
https://tel.archives-ouvertes.fr/tel-02528959/file/2020LIMO0011.pdf

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Design of transient optoelectronic sources with controlled waveforms

Autor: Reineix, Gwenaël

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______166::89ade147d1d335a2b1c62cf13daec094
https://theses.hal.science/tel-02528959

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Conference

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An {EM} Fault Injection Susceptibility Criterion and Its Application to the Localization of Hotspots

Autor: Maxime Madau, Philippe Maurine, Michel Agoyan

Publikováno v: 16th International Conference on Smart Card Research and Advanced Applications
CARDIS: Smart Card Research and Advanced Applications
CARDIS: Smart Card Research and Advanced Applications, Nov 2017, Lugano, Switzerland. pp.180-195, ⟨10.1007/978-3-319-75208-2_11⟩
Smart Card Research and Advanced Applications ISBN: 9783319752075
CARDIS

International audience; Electromagnetic (EM) fault injection has been proven efficient in attacking targets such as system-on-chip (SoC) or smartcards. Nonetheless, security characterisations, performed either by certification laboratories or by firm

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef65394e6de4f9e2637348c6a77581be
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02100194

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Electromagnetic fault injection: the curse of flip-flops

Autor: Ludovic Guillaume-Sage, Philippe Maurine, Sébastien Ordas

Publikováno v: Journal of Cryptographic Engineering
Journal of Cryptographic Engineering, Springer, 2017, 7 (3), pp.183-197. ⟨10.1007/s13389-016-0128-3⟩

International audience; Electromagnetic (EM) waves have been recently pointed out as a medium for fault injection within integrated circuits (IC). Indeed, it has been experimentally demonstrated that an EM pulse (EMP), produced with a high-voltage pu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0d2c85a1366b540024733c0f5ddb7e15
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01430913/file/Electromagnetic-fault-injection-the-curse-of-flip.pdf

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