Zobrazeno 1 - 10
of 24
pro vyhledávání: '"E. te Kaat"'
Publikováno v:
Fresenius' Journal of Analytical Chemistry. 341:241-244
Silicon samples of well-known nickel content have been produced by ion implantation in the dose range from 1017 to 1018 Ni/cm2. Such implants are used for the comparison of different approaches for quantitative Auger electron analysis. Considerable d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::954b9a17d038c8bd5ff7e8f66302c4f0
https://doi.org/10.1007/bf00321555
https://doi.org/10.1007/bf00321555
Autor:
Manfred Grasserbauer, Gernot Friedbacher, J.K.N. Lindner, A. Schönborn, E. te Kaat, H. Hubert
Publikováno v:
Fresenius' Zeitschrift für analytische Chemie. 333:511-515
The composition of deep-buried conductive layers formed by 6 MeV high dose Ni implantation into silicon at 450 K has been studied using AES and SIMS. For a dose of 1.3 × 1018 Ni/cm2, AES analysis yields a Ni to Si ratio close to NiSi2 stoichiometry
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::767574498140413e4c371e6d35fed57d
https://doi.org/10.1007/bf00572365
https://doi.org/10.1007/bf00572365
Publikováno v:
Physica Status Solidi (a). 76:K81-K84
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34c3952e05aefa0d9ded939a34369793
https://doi.org/10.1002/pssa.2210760167
https://doi.org/10.1002/pssa.2210760167
Publikováno v:
Physica Status Solidi (a). 47:751-762
Si crystals are implanted with 2 MeV O+ and Si+ ions. The ion and damage profiles are revealed by beveling. The implanted oxygen concentration is measured at the beveled surface with a microprobe. The radiation damage profile is investigated by high
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::914723341e1f33d8e2182fe5170aeeb5
https://doi.org/10.1002/pssa.2210470250
https://doi.org/10.1002/pssa.2210470250
Publikováno v:
Fresenius' Zeitschrift f�r Analytische Chemie. 319:616-621
Vergrabene Nitridschichten in Silicium werden durch Hochdosis-Ionenimplantation hergestellt und auf ihre Eignung als Kalibriermaterial fur die quantitative Dunnschichtanalyse gepruft. Dafur werden N+-Ionen (150 und 300 keV; 0,35–1·1018 N+ cm−2)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e54c78483cf2cf32aeaedc994494ee5b
https://doi.org/10.1007/bf01226734
https://doi.org/10.1007/bf01226734
Publikováno v:
Applied physics. 21:151-158
Oxygen profiles in silicon implanted with energies between 2 and 20 MeV by means of a Tandem accelerator have been investigated with a microprobe after bevelling the sample surface. It is shown that the measured profiles correspond to the implantatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb1d89345e6c872a5abc1cf33697f342
https://doi.org/10.1007/bf00900677
https://doi.org/10.1007/bf00900677
Autor:
U. Bonse, E. te Kaat
Publikováno v:
Zeitschrift für Physik A Hadrons and nuclei. 243:14-45
The influence of a different distance between beam splitterS and mirror crystalM on one hand and analyser crystalA on the other (“defocus” Δx) on the structure and the contrast of the fringe pattern of a Laue-case interferometer is investigated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b336fb27dda6e90b92e9a487164b472
https://doi.org/10.1007/bf01401026
https://doi.org/10.1007/bf01401026
Autor:
E. te Kaat, U. Bonse
Publikováno v:
Zeitschrift für Physik A Hadrons and nuclei. 214:16-21
The construction and successful operation of an X-ray interferometer consisting of twoseparate crystals is described. Alignment is made with the help of three X-ray beams that are multiply reflected by both crystals. The crystal lattice moire pattern
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::29322832fc05c597c3ec3d2e363a94f9
https://doi.org/10.1007/bf01380081
https://doi.org/10.1007/bf01380081
Publikováno v:
Journal of Scientific Instruments. 42:631-634
With the aid of an electrolytic saw, thin crystal slabs of selected orientation can be cut from rod-shaped metal single crystals to be studied by x-ray transmission techniques. A thin silk-insulated copper wire (without lacquer) soaked in dilute acid
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e21115a0f841311f2b2654783646943
https://doi.org/10.1088/0950-7671/42/8/337
https://doi.org/10.1088/0950-7671/42/8/337
Publikováno v:
EPM 87. Energy Pulse and Particle Beam Modification of Materials ISBN: 9783112611203
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6324b99bbdf894a0a3f1d6b1c1ffa71
https://doi.org/10.1515/9783112611203-136
https://doi.org/10.1515/9783112611203-136
