Zobrazeno 1 - 10
of 10
pro vyhledávání: '"E. V. Sysoev"'
Autor:
E. V. Sysoev, A. K. Potashnikov, Y. V. Obidin, T. N. Goryachkovskaya, V. S. Bazin, V. M. Popik, S. E. Peltek, N. A. Kolchanov
Publikováno v:
Вавиловский журнал генетики и селекции, Vol 16, Iss 4/1, Pp 858-865 (2014)
We designed and manufactured a system for detection of antibodies/antigenes in biological fluids. This system records the kinetics of free immunodiffusion of fluorescent nanocomplexes inside the channels of a microfluid module of a new-generation bio
Externí odkaz:
https://doaj.org/article/6c1526700c464bf0ac17c4f5a7643803
Publikováno v:
Interexpo GEO-Siberia. 8:60-65
The process of measuring the 3D relief of a cylindrical surface using an optical interference profilometer is described. The influence of the shape and orientation of the controlled surface on the error in measuring the depth of defects is considered
Publikováno v:
Interexpo GEO-Siberia. 8:66-71
It was presented the procedure of stitching surface regions measured by optical interference microscope to get a microrelief of large area. It was shown that usage of that procedure allows to perform measurements which are difficult at the processing
Autor:
N. A. Kamensky, E. V. Sysoev
Publikováno v:
Voprosy sovremennoj nauki i praktiki. Universitet imeni V.I. Vernadskogo. :196-202
Publikováno v:
Optoelectronics, Instrumentation and Data Processing. 43:476-480
A method for detecting surface defects is discussed. The method is based on analyzing the light scattering function with reference to the problem concerned with automatic control of a fuel cladding surface.
Publikováno v:
Journal of Mining Science. 43:555-564
A brief description is presented for a new digital-analog unit designed for recording and processing of signals from photodetectors of an X-ray luminescent separating machine, with a software-supported choice of the diamond detection methods taking i
Autor:
E. V. Sysoev
Publikováno v:
Optoelectronics, Instrumentation and Data Processing. 43:83-89
A method for measurement of a surface microprofile with a nanometer resolution is described. The method is based on partial scanning of correlograms in a Linnik white-light interferometer. Experimental results on measurements of thin film thickness a
Autor:
V. M. Zhigalkin, E. V. Sysoev, V. F. Yushkin, L. M. Stepnov, Yu. V. Chugui, I. V. Golubev, R. V. Kulikov, V. N. Oparin, A. K. Potashnikov
Publikováno v:
Journal of Mining Science. 41:385-392
An optoelectronic micrometer display sensor for determining deformations in samples of rocks and models of block geomedia is presented. The sensor is equipped with a microprocessor data collection system for the on-line detection of deformation chang
Autor:
E. V. Sysoev
Publikováno v:
Journal of Optical Technology. 83:613
The interference of partially coherent light in a three-mirror interferometer with a low-coherence light source is analyzed. It is shown that a set of coherence layers (polyzonal interference) is formed when the distance between the two mirrors mount
Publikováno v:
Journal of Optical Technology. 74:831
This paper presents a functionally complete optoelectronic micrometer position-sensitive sensor, the results of testing it, and a system for collecting data on strains in rock samples and concerning models of block geomedia involved in geomechanical