Zobrazeno 1 - 2
of 2
pro vyhledávání: '"E. V. Spesivsev"'
Autor:
K V Feklistov, A G Lemzyakov, I P Prosvirin, A A Gismatulin, A A Shklyaev, Y A Zhivodkov, G К Krivyakin, A I Komonov, А S Kozhukhov, E V Spesivsev, D V Gulyaev, D S Abramkin, A M Pugachev, D G Esaev, G Yu Sidorov
Publikováno v:
Materials Research Express, Vol 7, Iss 12, p 125903 (2020)
RF magnetron-deposited Si\In _2 O _3 :Er films have the structure of the single-crystalline bixbyite bcc In _2 O _3 nanowires bunched into the columns extended across the films. The obtained films have a typical In _2 O _3 optical band gap of 3.55 eV
Externí odkaz:
https://doaj.org/article/fb6f878faf224a02bcb567b91d396ae6
Autor:
D. V. Gulyaev, G. К Krivyakin, Igor P. Prosvirin, D. S. Abramkin, G. Yu Sidorov, A. I. Komonov, A. M. Pugachev, K. V. Feklistov, Y. A. Zhivodkov, E. V. Spesivsev, A. G. Lemzyakov, A. A. Shklyaev, A. A. Gismatulin, А S. Kozhukhov, D. G. Esaev
Publikováno v:
Materials Research Express. 7:125903
RF magnetron-deposited Si\In2O3:Er films have the structure of the single-crystalline bixbyite bcc In2O3 nanowires bunched into the columns extended across the films. The obtained films have a typical In2O3 optical band gap of 3.55 eV and demonstrate