Zobrazeno 1 - 10
of 68
pro vyhledávání: '"E. V. Demidov"'
Publikováno v:
Naučno-tehničeskij Vestnik Informacionnyh Tehnologij, Mehaniki i Optiki, Vol 13, Iss 1, Pp 113-118 (2013)
The influence of n-type impurity of tellurium (concentration range from 0.005 atomic % Te to 0.15 atomic % Te) on galvanic magnetic properties (resistivity, magnetic resistance and Hall constant) of Bi thin films with various thicknesses was studied.
Externí odkaz:
https://doaj.org/article/0fdc8f6b427543ec90e1b4b3cb8c1093
Autor:
E. V. Demidov
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 16:712-719
Publikováno v:
Semiconductors. 56:310-316
Autor:
GERDA Collaboration, M. Agostini, A. Alexander, G. Araujo, A. M. Bakalyarov, M. Balata, I. Barabanov, L. Baudis, C. Bauer, S. Belogurov, A. Bettini, L. Bezrukov, V. Biancacci, E. Bossio, V. Bothe, R. Brugnera, A. Caldwell, S. Calgaro, C. Cattadori, A. Chernogorov, P.-J. Chiu, T. Comellato, V. D’Andrea, E. V. Demidova, N. Di Marco, E. Doroshkevich, M. Fomina, A. Gangapshev, A. Garfagnini, C. Gooch, P. Grabmayr, V. Gurentsov, K. Gusev, J. Hakenmüller, S. Hemmer, W. Hofmann, J. Huang, M. Hult, L. V. Inzhechik, J. Janicskó Csáthy, J. Jochum, M. Junker, V. Kazalov, Y. Kermaïdic, H. Khushbakht, T. Kihm, K. Kilgus, I. V. Kirpichnikov, A. Klimenko, K. T. Knöpfle, O. Kochetov, V. N. Kornoukhov, P. Krause, V. V. Kuzminov, M. Laubenstein, M. Lindner, I. Lippi, A. Lubashevskiy, B. Lubsandorzhiev, G. Lutter, C. Macolino, B. Majorovits, W. Maneschg, G. Marshall, M. Misiaszek, M. Morella, Y. Müller, I. Nemchenok, M. Neuberger, L. Pandola, K. Pelczar, L. Pertoldi, P. Piseri, A. Pullia, C. Ransom, L. Rauscher, M. Redchuk, S. Riboldi, N. Rumyantseva, C. Sada, S. Sailer, F. Salamida, S. Schönert, J. Schreiner, A-K. Schütz, O. Schulz, M. Schwarz, B. Schwingenheuer, O. Selivanenko, E. Shevchik, M. Shirchenko, L. Shtembari, H. Simgen, A. Smolnikov, D. Stukov, S. Sullivan, A. A. Vasenko, A. Veresnikova, C. Vignoli, K. von Sturm, T. Wester, C. Wiesinger, M. Wojcik, E. Yanovich, B. Zatschler, I. Zhitnikov, S. V. Zhukov, D. Zinatulina, A. Zschocke, K. Zuber, G. Zuzel
Publikováno v:
European Physical Journal C: Particles and Fields, Vol 84, Iss 9, Pp 1-19 (2024)
Abstract A search for full energy depositions from bosonic keV-scale dark matter candidates of masses between 65 and 1021 keV has been performed with data collected during Phase II of the GERmanium Detector Array (Gerda) experiment. Our analysis incl
Externí odkaz:
https://doaj.org/article/0c38fc56ad6b4043a5f525f889a2d16b
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 15:841-845
We study the influence of an antimony sublayer (10 nm) on the structure and galvanomagnetic properties of bismuth–antimony films with an antimony content of 3 and 5 at %, up to 1-µm thick, obtained by discrete vacuum evaporation, as well as films
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 15:777-780
The results of studying the resistivity, magnetoresistance, and Hall coefficient of thin films of bismuth and the bismuth–antimony system on a borosilicate-glass substrate under plane tensile strain are presented. Deformation is created by a specia
Publikováno v:
Semiconductors. 56:22-24
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 15:467-470
The paper presents the results of measuring the thermopower and resistivity of bismuth films in the thickness range from 1 μm to 10 nm, obtained by thermal evaporation in vacuum. The study is carried out in the temperature range 77–300 K by a meth
Autor:
E. V. Demidov, M. V. Suslov, V. A. Komarov, M. V. Starytsin, V. M. Grabov, A. V. Suslov, V. A. Gerega
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 14:913-917
—A method for creating single-crystal bismuth films by melting and subsequent normal directed crystallization without a seed under a protective coating in a nitrogen atmosphere is proposed and tested. The high quality of the crystal structure of th
Autor:
A. M. Gorbachev, Vladimir A. Isaev, M. N. Drozdov, E. A. Arkhipova, S. A. Kraev, M. A. Lobaev, V. I. Shashkin, A. L. Vikharev, Yu. N. Drozdov, S. A. Bogdanov, E. V. Demidov, D. B. Radishchev
Publikováno v:
Technical Physics. 64:1827-1836
The formation of Au/Mo/Ti ohmic contacts to p-diamond epitaxial films has been studied. Specifically, the influence of annealing on the electrical properties and structure of contacts has been investigated. It has been shown that the upper gold layer