Zobrazeno 1 - 10
of 85
pro vyhledávání: '"E. Toussaere"'
Publikováno v:
Journal of the American Chemical Society. 122:6701-6709
A new methodology to study the second-order nonlinear optical coefficients of organic materials was developed. The combination of oriented crystal growth (epitaxy or grapho-epitaxy) with grazing incidence X-ray diffraction and second harmonic ellipso
Autor:
A. Rousseau, Joseph Zyss, Julienne Liang, R. Levenson, E. Toussaere, Bernard Boutevin, Dominique Bosc, C. Rossier, Franck Foll
Publikováno v:
Journal de Physique III. 4:2441-2450
The electro-optic properties of a new variety of cross-linked polymer referred to as Red-acid Magly are being reported. Its linear and nonlinear optical properties are characterized in comparison with the classical side-chain polymer DR1-MMA. The com
Publikováno v:
Microelectronic Engineering. 25:229-234
In-situ laser reflectometry was used at four different test wavelengths to monitor the thickness of GaAs/GaAlAs layers grown by metal organic vapor phase epitaxy. The studied wavelengths are 1.32 μm, 633 nm, 514 nm, and 442 nm. The effective optical
Publikováno v:
J. Mater. Chem.. 4:1855-1860
Poled hybrid siloxane–oxide coatings synthesized through hydrolysis and condensation from tetramethoxysilane (TMOS) and N-[3-triethoxysilylpropyl]-2,4-dinitrophenylamine (TSDP) precursors have been characterized via second-harmonic generation (SHG)
Publikováno v:
Proceedings of 8th International Conference on Indium Phosphide and Related Materials.
A basic dielectric waveguide structure (anti-resonant reflexion optical waveguide) has been studied and fabricated directly on InP. The use of photo-assisted deposition techniques has allowed us to taylor the structural properties of each deposited f
Publikováno v:
Applied Physics Letters. 63:3479-3481
In situ reflectometry with a 514‐nm laser beam was used to monitor AlAs and GaAs layer thicknesses grown by metalorganic vapor phase epitaxy. The effective optical indices of these materials have been calibrated at the growth temperature by using a
Publikováno v:
Conference on Lasers and Electro-Optics (CLEO 2000). Technical Digest. Postconference Edition. TOPS Vol.39 (IEEE Cat. No.00CH37088).
Summary form only given. Solid-state organic luminescent materials, conjugated polymers and systems based on organic small molecules attract a revival of interest as innovative approaches towards solid-state photonic applications including display an
Publikováno v:
ACS Symposium Series ISBN: 9780841232631
Polymers for Second-Order Nonlinear Optics
Polymers for Second-Order Nonlinear Optics
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1756c9e1aca3ce8909db5030397a1972
https://doi.org/10.1021/bk-1995-0601.ch032
https://doi.org/10.1021/bk-1995-0601.ch032
Autor:
S. Bauer, S. Bauer-Gogonea, S. Yilmaz, C. Dinger, W. Wirges, R. Gerhard-Multhaupt, F. Michelotti, E. Toussaere, R. Levenson, J. Liang, J. Zyss
Publikováno v:
Organic Thin Films for Photonic Applications.
Cross-linking of nonlinear optical polymers during the poling process is an interesting way to increase the thermal stability of the dipole orientation [1]. For the optimization of the poling process in cross-linking polymers, experimental techniques
Autor:
E. Toussaere, J. Zyss
Publikováno v:
Organic Thin Films for Photonic Applications.
Spectroscopic ellipsometry is an optical technique which can provide the depolarization ratio between s or p polarized waves after reflection on a sample. This method is indirect but subsequent multilayer modelling and different techniques such as it