Zobrazeno 1 - 10
of 17
pro vyhledávání: '"E. R. Kieft"'
Publikováno v:
Structural Dynamics, Vol 10, Iss 6, Pp 064301-064301-5 (2023)
Pump-probe experiments in ultrafast electron microscopy require temporal overlap between the pump and probe pulses. Accurate measurements of the time delay between them allows for the determination of the time zero, the moment in time where both puls
Externí odkaz:
https://doaj.org/article/b0ddaceec88f4f9cafc3317866b51ed4
Publikováno v:
Structural Dynamics, Vol 5, Iss 5, Pp 051101-051101-8 (2018)
The possibility to perform high-resolution time-resolved electron energy loss spectroscopy has the potential to impact a broad range of research fields. Resolving small energy losses with ultrashort electron pulses, however, is an enormous challenge
Externí odkaz:
https://doaj.org/article/91bc7ccacfb44a7eaa6a0b28930c11f7
Autor:
W. Verhoeven, J. F. M. van Rens, M. A. W. van Ninhuijs, W. F. Toonen, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten
Publikováno v:
Structural Dynamics, Vol 3, Iss 5, Pp 054303-054303-7 (2016)
We demonstrate the use of two TM110 resonant cavities to generate ultrashort electron pulses and subsequently measure electron energy losses in a time-of-flight type of setup. The method utilizes two synchronized microwave cavities separated by a dri
Externí odkaz:
https://doaj.org/article/edad91a36d774486a16c0e91f6f98933
Autor:
W, Verhoeven, J F M, van Rens, A H, Kemper, E H, Rietman, H A, van Doorn, I, Koole, E R, Kieft, P H A, Mutsaers, O J, Luiten
Publikováno v:
The Review of scientific instruments. 90(8)
Microwave cavities oscillating in the TM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::db2794b6d1188ca44f92185e2a7ed33f
https://pubmed.ncbi.nlm.nih.gov/31472630
https://pubmed.ncbi.nlm.nih.gov/31472630
Autor:
Petra Specht, Bert Freitag, E. R. Kieft, David F. Yancey, Jom Luiten, Peter N. Nickias, Steve Rozeveld, Christian Kisielowski, W. Verhoeven, P. H. A. Mutsaers, Jasper F. M. van Rens, Joo Kang, Alyssa J. McKenna
Publikováno v:
Advanced Functional Materials, 29(11):1807818. Wiley-VCH Verlag
A combination of atomic resolution phase contrast electron microscopy and pulsed electron beams reveals pristine properties of MgCl2 at 1.7 Å resolution that were previously masked by air and beam damage. Both the inter- and intra-layer bonding in p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::32b81a736e6f65295eaef2311a2e547f
https://doi.org/10.1002/adfm.201807818
https://doi.org/10.1002/adfm.201807818
Autor:
Jacob P. Hoogenboom, Pieter Kruit, Lixin Zhang, E. R. Kieft, Robert J. Moerland, I.G.C. Weppelman
Publikováno v:
Structural Dynamics, 6(2)
Structural Dynamics, Vol 6, Iss 2, Pp 024102-024102-11 (2019)
Structural Dynamics
Structural Dynamics, Vol 6, Iss 2, Pp 024102-024102-11 (2019)
Structural Dynamics
Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to chop the beam that originates from a high brightness Schottky source may provide an attractive alternat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37ff5fa6ba6c4a81563ecefffcc8589a
http://resolver.tudelft.nl/uuid:8cc715a1-18e6-46f8-96f4-0c6ecafe7aae
http://resolver.tudelft.nl/uuid:8cc715a1-18e6-46f8-96f4-0c6ecafe7aae
Publikováno v:
Applied Physics Letters, 113(16):163104. American Institute of Physics
This paper presents the experimental realization of an ultrafast electron microscope operating at a repetition rate of 75 MHz based on a single compact resonant microwave cavity operating in a dual mode. This elliptical cavity supports two orthogonal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7094e06c7990f3b9e79f13e54149611b
http://www.scopus.com/inward/record.url?scp=85055053846&partnerID=8YFLogxK
http://www.scopus.com/inward/record.url?scp=85055053846&partnerID=8YFLogxK
Autor:
Jasper F. M. van Rens, Christian Kisielowski, Peter H. A. Mutsaers, Joo Kang, Peter N. Nickias, W. Verhoeven, E. R. Kieft, Steve Rozeveld, Jom Luiten, Alyssa J. McKenna, Bert Freitag, David F. Yancey, Petra Specht
Publikováno v:
Microscopy and Microanalysis. 25:1652-1653
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::063217f8d84b3758b68f0ca50393b372
https://doi.org/10.1017/s1431927619008997
https://doi.org/10.1017/s1431927619008997
Publikováno v:
Microscopy and Microanalysis. 25:1666-1667
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2cc707b85fea832a80439b299c21e436
https://doi.org/10.1017/s1431927619009061
https://doi.org/10.1017/s1431927619009061
Autor:
O.J. Luiten, J.F.M. van Rens, A. Lassise, Peter H. A. Mutsaers, E. R. Kieft, J.G.H. Franssen, X. F. D. Stragier, W. Verhoeven
Publikováno v:
Ultramicroscopy, 184B, 77-89. Elsevier
We present a theoretical description of resonant radiofrequency (RF) deflecting cavities in TM$_{110}$ mode as dynamic optical elements for ultrafast electron microscopy. We first derive the optical transfer matrix of an ideal pillbox cavity and use
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3a1aa0b5054a05c9aec8f965edf3e827
http://arxiv.org/abs/1707.08835
http://arxiv.org/abs/1707.08835