Zobrazeno 1 - 10
of 19
pro vyhledávání: '"E. N. Farabaugh"'
E-beam codeposition was used to produce thin films in the system ZrO 2 -SiO 2 . Bk-7 glass, heated to 325 °C was used as substrate material for these depositions. The films, thus produced were studied by X-ray Diffraction and Scanning Electron Micro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc44ecd69ec8f930f4780098feb922eb
https://doi.org/10.1520/stp37270s
https://doi.org/10.1520/stp37270s
Autor:
Albert Feldman, E. N. Farabaugh
A guided wave technique has been used to measure the refractive index and thickness of a thin film. The film, which contained approximately 90 mol % MgO and 10 mol % SiO 2 was produced by coevaporation of the two constituents onto a fused silica subs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4dbabeee8b53d446da8307a926c05742
https://doi.org/10.1520/stp37264s
https://doi.org/10.1520/stp37264s
The influence of filament geometry on growth rate and morphology has been observed on diamond films deposited on single crystal silicon substrates in a hot filament CVD reactor. Single and dual helical W filaments having 5, 10, or 15 turns and CH4 :H
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ecbe9554253bc66571d1d8be0f1e0cb
https://doi.org/10.21236/ada231818
https://doi.org/10.21236/ada231818
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 5:1671-1674
The microstructure of thin films of ZrO2 and ZrO2–SiO2 formed by electron‐beam coevaporation have been examined by x‐ray diffraction and transmission electron microscopy. Results of these examinations suggest that films composed of 100% ZrO2 gr
Publikováno v:
Journal of Applied Physics. 47:736-740
The utilization of Pb1−xSnxTe epitaxial films in high‐density forward‐looking infrared (FLIR) arrays has been hampered thus far by cleavage steps in the substrates. We have developed a chemical‐mechanical polishing technique for the (111) sur
Autor:
E. N. Farabaugh, D. M. Sanders
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 1:356-359
X‐ray diffraction measurements were made on a series of mixed films in the ZrO2–MgO and ZrO2–SiO2 systems as part of a larger study to investigate the relationship between processing parameters and morphology of dielectric thin films produced b
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 4:2969-2974
Coevaporated e‐beam films show modification of structure and properties that depend on composition. In pure zirconia films, x‐ray diffraction indicates two crystal phases present and scanning electron microscopy (SEM) shows a columnar structure.
Publikováno v:
Journal of Applied Crystallography. 6:482-486
The most commonly used geometry for the Berg–Barrett X-ray microscopy uses the zero-layer reflections as described by Newkirk. It can be shown that non-zero-layer reflections, skew-plane reflections, can be used equally well to obtain X-ray microgr
Autor:
E. N. Farabaugh, D. J. Barber
Publikováno v:
Journal of Applied Physics. 36:2803-2806
Single crystals of rutile, grown by the Verneuil method, have been chemically thinned and examined by electron transmission microscopy. The density and distribution of dislocations agree with that expected from etch pit data. This density is at least