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Surface evolution of Ni-V transparent oxide films upon Li insertion reactions

Autor: F. Artuso, Carlo Coluzza, G. Di Santo, E. Masetti, Robertino Zanoni, N. Cimino, Franco Decker

Publikováno v: Surface and Interface Analysis. 33:815-824

A detailed picture is reported of the nature of an Li insertion Ni–V mixed-oxide electrode and of its evolution upon prolonged intercalation/deintercalation cycles. A combination of bulk and surface-sensitive techniques is used, including electroch

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::39b51e9fcda79004aee319b4d4997bc8
https://doi.org/10.1002/sia.1458

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Variability of the large scale general circulation of the Mediterranean Sea from observations and modelling: a review

Autor: E. Masetti, Nadia Pinardi

Publikováno v: Palaeogeography, palaeoclimatology, palaeoecology 158 (2000): 153–174. doi:10.1016/S0031-0182(00)00048-1
info:cnr-pdr/source/autori:Pinardi, N; Masetti, E/titolo:Variability of the large scale general circulation of the Mediterranean Sea from observations and modelling: a review/doi:10.1016%2FS0031-0182(00)00048-1/rivista:Palaeogeography, palaeoclimatology, palaeoecology/anno:2000/pagina_da:153/pagina_a:174/intervallo_pagine:153–174/volume:158

In this paper we present an overview of the most recent findings about the Mediterranean Sea present-day circulation structure. Both historical observations and numerical model simulations are presented, outlining the differences and agreement. The m

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d72e44accb60953ff2a959994065344d
https://doi.org/10.1016/s0031-0182(00)00048-1

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Thermal and excimer laser assisted growth of Si(1−x)Gex alloys from Si2H6 and GeH4 monitored by on line single wavelength ellipsometry and ex situ atomic force microscopy

Autor: I. Vianey, Marco Montecchi, S. Pieretti, Rosanna Larciprete, G. Padeletti, S. Cozzi, E. Masetti

Publikováno v: Scopus-Elsevier

Single wavelength ellipsometry was used to monitor the growth of Si(1−x)Gex alloys obtained by ultrahigh vacuum chemical vapor deposition (CVD) at 570 °C on Si and to evaluate the effect of sample irradiation by KrF excimer laser pulses at an ener

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f515b5baff265271051ebfd6a5edc1c3
https://doi.org/10.1116/1.581082

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Growth of Ge layers on Si(100) monitored by in situ ellipsometry

Autor: Rosanna Larciprete, S. Cozzi, Marco Montecchi, E. Masetti, G. Padeletti

Publikováno v: Scopus-Elsevier

Ellipsometric monitoring of the growth of Ge layers on Si(100) by pyrolysis of GeH 4 at substrate temperatures of 400, 450 and 500°C was performed by using a single wavelength ellipsometer based on the four detector photopolarimeter. By coupling ell

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c28a1ff1d045833bbf872904ac2d61c8
https://doi.org/10.1016/s0040-6090(97)00585-3

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Ellipsometric methods for absorbing layers: a modified downhill simplex algorithm

Autor: Salvador Bosch, F. Monzonis, E Masetti

Publikováno v: Scopus-Elsevier

A modified downhill simplex algorithm for single wavelength ellipsometry is presented. The algorithm finds the best-fitting solution (n, k, d) for a sample consisting of a single absorbing layer when ellipsometric data corresponding to different inci

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1bd80d29b532eb0c0cd10a695ad5b005
https://doi.org/10.1016/s0040-6090(96)08933-x

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UHV-CVD Ge/Si(100) heteroepitaxy monitored by in situ ellipsometry

Autor: S. Cozzi, E. Masetti, Rosanna Larciprete, M. Montecchi

Publikováno v: Applied Surface Science. 102:52-56

A low cost ellipsometer based on the four detector photopolarimeter was utilized for in situ monitoring of Ge film deposition on Si. The best fit of the Ψ-Δ trajectory, correlated with XPS analysis, allowed to evidence the sensitivity in the sub-mo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b5ff434d94b34b393136ce7175b13c46
https://doi.org/10.1016/0169-4332(96)00018-9

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Thickness and model optimization in characterization of optical interference films by using discontinuities of n(lambda) solutions

Autor: M Montecchi, E Masetti, G Emiliani

Publikováno v: Pure and Applied Optics: Journal of the European Optical Society Part A. 4:15-26

The characterization of inhomogeneous thin film has been a widely studied topic. In the present work an inhomogeneous film model where the real part of the refractive index has a parabolic profile through the film thickness is supposed and a procedur

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b71bbba40d3c6d876eb5ec0725113c9e
https://doi.org/10.1088/0963-9659/4/1/003

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Sawtooth phase modulating interferometry for the measurement of reflectivity and phase profiles of CO2laser graded reflectivity mirrors

Autor: E Masetti, A Colucci, E Nichelatti, M Montecchi

Publikováno v: Pure and Applied Optics: Journal of the European Optical Society Part A. 3:573-583

The knowledge of the reflectivity and phase profiles of graded reflectivity mirrors (GRMs) is important for studying the performance of lasers equipped with optical unstable resonators that use a GRM as output coupler. This paper deals with a low cos

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::17d3411ead79951fbad9eba9fbcda9c0
https://doi.org/10.1088/0963-9659/3/4/019

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